Mira Bakshi

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Hayward, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for measuring peak carrier concentration in ultra-shallow ju...
- Patent number 7,403,022
- Issue date Jul 22, 2008
- KLA-Tencor, Inc.
- Alex Salnik
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring ion-implanted semiconductors with improved rep...
- Patent number 7,330,260
- Issue date Feb 12, 2008
- KLA-Tencor Corporation
- Lena Nicolaides
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method for measuring peak carrier concentration in ultra-shallow ju...
- Publication number 20060166385
- Publication date Jul 27, 2006
- Alex Salnik
- G01 - MEASURING TESTING
Information Patent Application
Method for measuring ion-implanted semiconductors with improved rep...
- Publication number 20050195399
- Publication date Sep 8, 2005
- Lena Nicolaides
- G01 - MEASURING TESTING