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Miroslav Hain
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Ibaraki, JP
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last 30 patents
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Patent Grant
Optical characteristic measuring apparatus
Patent number
8,982,345
Issue date
Mar 17, 2015
National Institute of Advanced Industrial Science and Technology
Etsuo Kawate
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
OPTICAL CHARACTERISTIC MEASURING APPARATUS
Publication number
20140002825
Publication date
Jan 2, 2014
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
Etsuo Kawate
G02 - OPTICS