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Turku, FI
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Patents Grants
last 30 patents
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Patent Grant
Method for analysing a sample comprising at least a first and a sec...
Patent number
10,241,047
Issue date
Mar 26, 2019
Kemira Oyj
Vesa Nuutinen
G01 - MEASURING TESTING
Information
Patent Grant
Method for analysing a sample comprising at least a first and a sec...
Patent number
9,816,927
Issue date
Nov 14, 2017
Kemira Oyj
Vesa Nuutinen
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Method for analysing a sample comprising at least a first and a sec...
Publication number
20180017494
Publication date
Jan 18, 2018
KEMIRA OYJ
Vesa Nuutinen
G01 - MEASURING TESTING
Information
Patent Application
Method for analysing a sample comprising at least a first and a sec...
Publication number
20160290924
Publication date
Oct 6, 2016
KEMIRA OYJ
Vesa Nuutinen
G01 - MEASURING TESTING