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Misa Sawanobori
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Yokohama-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Method for connecting electronic device
Patent number
7,370,412
Issue date
May 13, 2008
Kabushiki Kaisha Toshiba
Toshiro Hiraoka
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Wiring member and method of manufacturing the same
Patent number
7,329,458
Issue date
Feb 12, 2008
Kabushiki Kaisha Toshiba
Toshiro Hiraoka
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Semiconductor test unit having low contact resistance with examined...
Patent number
7,312,621
Issue date
Dec 25, 2007
Kabushiki Kaisha Toshiba
Naoko Yamaguchi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Semiconductor test unit having low contact resistance with examined...
Publication number
20040205402
Publication date
Oct 14, 2004
Kabushiki Kaisha Toshiba
Naoko Yamaguchi
G01 - MEASURING TESTING
Information
Patent Application
Wiring member and method of manufacturing the same
Publication number
20040191497
Publication date
Sep 30, 2004
Toshiro Hiraoka
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Method for connecting electronic device
Publication number
20040009683
Publication date
Jan 15, 2004
Kabushiki Kaisha Toshiba
Toshiro Hiraoka
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR