Mishio Hayashi

Person

Saitama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Wire harness checker and wire harness checking method
- Patent number 7,495,452
- Issue date Feb 24, 2009
- SUMITOMO WIRING SYSTEMS, LTD.
- Mishio Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Conductor inspection apparatus and conductor inspection method
- Patent number 7,332,914
- Issue date Feb 19, 2008
- OHT Inc.
- Shuji Yamaoka
- G01 - MEASURING TESTING
Information Patent Grant
Time measuring device and testing apparatus
- Patent number 6,574,168
- Issue date Jun 3, 2003
- Advantest Corporation
- Mishio Hayashi
- G04 - HOROLOGY
Information Patent Grant
Frequency measuring apparatus
- Patent number 5,764,045
- Issue date Jun 9, 1998
- Advantest Corporation
- Mishio Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Analog arithmetic circuit
- Patent number 5,757,221
- Issue date May 26, 1998
- Advantest Corp.
- Mishio Hayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pulse signal measuring instrument
- Patent number 5,381,100
- Issue date Jan 10, 1995
- Advantest Corporation
- Mishio Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Frequency deviation measuring apparatus
- Patent number 5,325,049
- Issue date Jun 28, 1994
- Advantest Corporation
- Mishio Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Time interval measuring apparatus
- Patent number 5,319,614
- Issue date Jun 7, 1994
- Advantest Corporation
- Mishio Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Jitter analyzer
- Patent number 5,293,520
- Issue date Mar 8, 1994
- Advantest Corporation
- Mishio Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Data multiplexing device
- Patent number 5,239,546
- Issue date Aug 24, 1993
- Advantest Corporation
- Mishio Hayashi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Pattern synchronizing circuit and method
- Patent number 5,163,069
- Issue date Nov 10, 1992
- Advantest Corporation
- Mishio Hayashi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
High-rate pulse pattern generator
- Patent number 5,150,390
- Issue date Sep 22, 1992
- Advantest Corporation
- Mishio Hayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pseudo random pattern generating device
- Patent number 4,901,264
- Issue date Feb 13, 1990
- Advantest Corporation
- Mishio Hayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data pattern synchronizer
- Patent number 4,878,233
- Issue date Oct 31, 1989
- Advantest Corporation
- Mishio Hayashi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Continuous counting device
- Patent number 4,870,664
- Issue date Sep 26, 1989
- Advantest Corporation
- Mishio Hayashi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Period and frequency measuring instrument
- Patent number RE32845
- Issue date Jan 24, 1989
- Advantest Corporation
- Mishio Hayashi
- 324 - Electricity: measuring and testing
Information Patent Grant
Successive period-to-voltage converting apparatus
- Patent number 4,769,798
- Issue date Sep 6, 1988
- Advantest Corporation
- Mishio Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Time interval measuring instrument
- Patent number 4,611,926
- Issue date Sep 16, 1986
- Takeda Riken Kogyo Kabushikikaisha
- Mishio Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Phase difference measuring apparatus
- Patent number 4,600,994
- Issue date Jul 15, 1986
- Takeda Riken Kogyo Kabushikikaisha
- Mishio Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Period and frequency measuring instrument
- Patent number 4,544,884
- Issue date Oct 1, 1985
- Takeda Riken Co., Ltd.
- Mishio Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Interval-expanding timer
- Patent number 4,523,288
- Issue date Jun 11, 1985
- Takeda Riken Co., Ltd.
- Mishio Hayashi
- G04 - HOROLOGY

Patents Applicationslast 30 patents

Information Patent Application
Wire harness checker and wire harness checking method
- Publication number 20070184686
- Publication date Aug 9, 2007
- SUMITOMO WIRING SYSTEMS, LTD.
- Mishio Hayashi
- G01 - MEASURING TESTING
Information Patent Application
Conductior position inspection apparatus and conductor position ins...
- Publication number 20070073512
- Publication date Mar 29, 2007
- Shuji Yamaoka
- G01 - MEASURING TESTING
Information Patent Application
Conductor inspection apparatus and conductor inspection method
- Publication number 20060226851
- Publication date Oct 12, 2006
- Shuji Yamaoka
- G01 - MEASURING TESTING

Mishio Hayashi

Person

Patents Grantslast 30 patents

Wire harness checker and wire harness checking method

Conductor inspection apparatus and conductor inspection method

Time measuring device and testing apparatus

Frequency measuring apparatus

Analog arithmetic circuit

Pulse signal measuring instrument

Frequency deviation measuring apparatus

Time interval measuring apparatus

Jitter analyzer

Data multiplexing device

Pattern synchronizing circuit and method

High-rate pulse pattern generator

Pseudo random pattern generating device

Data pattern synchronizer

Continuous counting device

Period and frequency measuring instrument

Successive period-to-voltage converting apparatus

Time interval measuring instrument

Phase difference measuring apparatus

Period and frequency measuring instrument

Interval-expanding timer

Patents Applicationslast 30 patents

Wire harness checker and wire harness checking method

Conductior position inspection apparatus and conductor position ins...

Conductor inspection apparatus and conductor inspection method