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Mitchell B. Haeri
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Irvine, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Broadband graphene-based optical limiter for the protection of back...
Patent number
10,217,875
Issue date
Feb 26, 2019
Raytheon Company
Michael Ushinsky
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sacrificial limiter filter
Patent number
9,463,977
Issue date
Oct 11, 2016
Raytheon Company
Michael Ushinsky
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Broadband graphene-based optical limiter for the protection of back...
Patent number
9,397,237
Issue date
Jul 19, 2016
Raytheon Company
Michael Ushinsky
G02 - OPTICS
Information
Patent Grant
Detecting a target using an optical augmentation sensor
Patent number
7,978,330
Issue date
Jul 12, 2011
Raytheon Company
Hector M. Reyes, Jr.
G01 - MEASURING TESTING
Information
Patent Grant
Gaseous laser power limiter initiated by nuclear radiation
Patent number
5,299,068
Issue date
Mar 29, 1994
Hughes Aircraft Company
David B. Cohn
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
BROADBAND GRAPHENE-BASED OPTICAL LIMITER FOR THE PROTECTION OF BACK...
Publication number
20160315205
Publication date
Oct 27, 2016
Raytheon Company
Michael Ushinsky
G02 - OPTICS
Information
Patent Application
Photovoltaic Device For Generating Electrical Power Using Nonlinear...
Publication number
20150372168
Publication date
Dec 24, 2015
Raytheon Company
Partha Sarathi Dutta
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
BROADBAND GRAPHENE-BASED OPTICAL LIMITER FOR THE PROTECTION OF BACK...
Publication number
20150171234
Publication date
Jun 18, 2015
Raytheon Company
Michael Ushinsky
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SACRIFICIAL LIMITER FILTER
Publication number
20140036369
Publication date
Feb 6, 2014
Raytheon Company
Michael Ushinsky
B82 - NANO-TECHNOLOGY
Information
Patent Application
Detecting a target using an optical augmentation sensor
Publication number
20090237668
Publication date
Sep 24, 2009
Raytheon Company
Hector M. Reyes, JR.
G01 - MEASURING TESTING