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Mitchell SENGER
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Portland, OR, US
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last 30 patents
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Patent Application
METHODS AND APPARATUS FOR FAULT ISOLATION WITH SCANNING ELECTRON MI...
Publication number
20250208208
Publication date
Jun 26, 2025
Intel Corporation
Joshua Kevek
G01 - MEASURING TESTING
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Patent Application
SKELETON ETCH FOR SEMICONDUCTOR CHIPS
Publication number
20250201707
Publication date
Jun 19, 2025
Intel Corporation
Shida TAN
H01 - BASIC ELECTRIC ELEMENTS
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Patent Application
FAULT ISOLATION VIA ELECTRON PHOTOEMISSION MICROSCOPY
Publication number
20240272412
Publication date
Aug 15, 2024
Intel Corporation
Joshua KEVEK
G02 - OPTICS
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Patent Application
ENHANCED ELECTRON BEAM (E-BEAM) APPARATUS AND METHODOLOGY WITH NANO...
Publication number
20240219460
Publication date
Jul 4, 2024
Xianghong TONG
G01 - MEASURING TESTING