Mitesh A. AGRAWAL

Person

Jalgaon, IN

People

Patents Grantslast 30 patents

Information Patent Grant
Simultaneous scan chain initialization with disparate latches
- Patent number 10,658,062
- Issue date May 19, 2020
- International Business Machines Corporation
- Mitesh Agrawal
- G11 - INFORMATION STORAGE
Information Patent Grant
Methods and systems for performing test and calibration of integrat...
- Patent number 10,598,526
- Issue date Mar 24, 2020
- International Business Machines Corporation
- Mitesh Agrawal
- G01 - MEASURING TESTING
Information Patent Grant
Simultaneous scan chain initialization with disparate latches
- Patent number 10,586,606
- Issue date Mar 10, 2020
- International Business Machines Corporation
- Mitesh Agrawal
- G11 - INFORMATION STORAGE
Information Patent Grant
Performing system functional test on a chip having partial-good por...
- Patent number 10,571,519
- Issue date Feb 25, 2020
- International Business Machines Corporation
- Mitesh A. Agrawal
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for performing test and calibration of integrat...
- Patent number 10,365,132
- Issue date Jul 30, 2019
- International Business Machines Corporation
- Mitesh Agrawal
- G01 - MEASURING TESTING
Information Patent Grant
Simultaneous scan chain initialization with disparate latches
- Patent number 10,199,121
- Issue date Feb 5, 2019
- International Business Machines Corporation
- Mitesh Agrawal
- G11 - INFORMATION STORAGE
Information Patent Grant
Simultaneous scan chain initialization with disparate latches
- Patent number 10,096,377
- Issue date Oct 9, 2018
- International Business Machines Corporation
- Mitesh Agrawal
- G11 - INFORMATION STORAGE
Information Patent Grant
Simultaneous scan chain initialization with disparate latches
- Patent number 10,026,498
- Issue date Jul 17, 2018
- International Business Machines Corporation
- Mitesh Agrawal
- G11 - INFORMATION STORAGE
Information Patent Grant
Distributing spare latch circuits in integrated circuit designs
- Patent number 8,832,626
- Issue date Sep 9, 2014
- International Business Machines Corporation
- Mitesh A. Agrawal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Distributing spare latch circuits in integrated circuit designs
- Patent number 8,490,039
- Issue date Jul 16, 2013
- International Business Machines Corporation
- Mitesh A. Agrawal
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SIMULTANEOUS SCAN CHAIN INITIALIZATION WITH DISPARATE LATCHES
- Publication number 20200005883
- Publication date Jan 2, 2020
- International Business Machines Corporation
- Mitesh Agrawal
- G11 - INFORMATION STORAGE
Information Patent Application
SIMULTANEOUS SCAN CHAIN INITIALIZATION WITH DISPARATE LATCHES
- Publication number 20190156907
- Publication date May 23, 2019
- International Business Machines Corporation
- Mitesh Agrawal
- G11 - INFORMATION STORAGE
Information Patent Application
METHODS AND SYSTEMS FOR PERFORMING TEST AND CALIBRATION OF INTEGRAT...
- Publication number 20180306610
- Publication date Oct 25, 2018
- International Business Machines Corporation
- Mitesh Agrawal
- G01 - MEASURING TESTING
Information Patent Application
SIMULTANEOUS SCAN CHAIN INITIALIZATION WITH DISPARATE LATCHES
- Publication number 20180294041
- Publication date Oct 11, 2018
- International Business Machines Corporation
- Mitesh Agrawal
- G11 - INFORMATION STORAGE
Information Patent Application
SIMULTANEOUS SCAN CHAIN INITIALIZATION WITH DISPARATE LATCHES
- Publication number 20180294042
- Publication date Oct 11, 2018
- International Business Machines Corporation
- Mitesh Agrawal
- G11 - INFORMATION STORAGE
Information Patent Application
PERFORMING SYSTEM FUNCTIONAL TEST ON A CHIP HAVING PARTIAL-GOOD POR...
- Publication number 20170261551
- Publication date Sep 14, 2017
- International Business Machines Corporation
- Mitesh A. Agrawal
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR PERFORMING TEST AND CALIBRATION OF INTEGRAT...
- Publication number 20170261354
- Publication date Sep 14, 2017
- International Business Machines Corporation
- Mitesh Agrawal
- G01 - MEASURING TESTING
Information Patent Application
DISTRIBUTING SPARE LATCH CIRCUITS IN INTEGRATED CIRCUIT DESIGNS
- Publication number 20130191801
- Publication date Jul 25, 2013
- International Business Machines Corporation
- Mitesh A. AGRAWAL
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DISTRIBUTING SPARE LATCH CIRCUITS IN INTEGRATED CIRCUIT DESIGNS
- Publication number 20130152029
- Publication date Jun 13, 2013
- International Business Machines Corporation
- Mitesh A. AGRAWAL
- G06 - COMPUTING CALCULATING COUNTING

Mitesh A. AGRAWAL

Person

Patents Grantslast 30 patents

Simultaneous scan chain initialization with disparate latches

Methods and systems for performing test and calibration of integrat...

Simultaneous scan chain initialization with disparate latches

Performing system functional test on a chip having partial-good por...

Methods and systems for performing test and calibration of integrat...

Simultaneous scan chain initialization with disparate latches

Simultaneous scan chain initialization with disparate latches

Simultaneous scan chain initialization with disparate latches

Distributing spare latch circuits in integrated circuit designs

Distributing spare latch circuits in integrated circuit designs

Patents Applicationslast 30 patents

SIMULTANEOUS SCAN CHAIN INITIALIZATION WITH DISPARATE LATCHES

SIMULTANEOUS SCAN CHAIN INITIALIZATION WITH DISPARATE LATCHES

METHODS AND SYSTEMS FOR PERFORMING TEST AND CALIBRATION OF INTEGRAT...

SIMULTANEOUS SCAN CHAIN INITIALIZATION WITH DISPARATE LATCHES

SIMULTANEOUS SCAN CHAIN INITIALIZATION WITH DISPARATE LATCHES

PERFORMING SYSTEM FUNCTIONAL TEST ON A CHIP HAVING PARTIAL-GOOD POR...

METHODS AND SYSTEMS FOR PERFORMING TEST AND CALIBRATION OF INTEGRAT...

DISTRIBUTING SPARE LATCH CIRCUITS IN INTEGRATED CIRCUIT DESIGNS

DISTRIBUTING SPARE LATCH CIRCUITS IN INTEGRATED CIRCUIT DESIGNS