Mitsuaki Igeta

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device for effectively disperse heat generated from h...
- Patent number 8,946,857
- Issue date Feb 3, 2015
- Fujitsu Limited
- Mitsuaki Igeta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of defining shape and position of dummy active region by pro...
- Patent number 8,683,406
- Issue date Mar 25, 2014
- Fujitsu Semiconductor Limited
- Mitsuaki Igeta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Support program, design support system, and design support method
- Patent number 8,468,481
- Issue date Jun 18, 2013
- Fujitsu Semiconductor Limited
- Toshiharu Nozawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor integrated circuit and evaluation method of wiring in...
- Patent number 7,106,108
- Issue date Sep 12, 2006
- Fujitsu Limited
- Mitsuaki Igeta
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PATTERNING METHOD AND SEMICONDUCTOR DEVICE
- Publication number 20120297353
- Publication date Nov 22, 2012
- FUJITSU SEMICONDUCTOR LIMITED
- Mitsuaki IGETA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE PRODUCTION METHOD
- Publication number 20120068308
- Publication date Mar 22, 2012
- FUJITSU SEMICONDUCTOR LIMITED
- Mitsuaki Igeta
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DESIGN SUPPORT PROGRAM, DESIGN SUPPORT SYSTEM, AND DESIGN SUPPORT M...
- Publication number 20110041113
- Publication date Feb 17, 2011
- FUJITSU SEMICONDUCTOR LIMITED
- Toshiharu NOZAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERNING METHOD AND SEMICONDUCTOR DEVICE
- Publication number 20090315139
- Publication date Dec 24, 2009
- Fujitsu Microelectronics Limited
- Mitsuaki IGETA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor integrated circuit and evaluation method of wiring in...
- Publication number 20050144546
- Publication date Jun 30, 2005
- FUJITSU LIMITED
- Mitsuaki Igeta
- G01 - MEASURING TESTING