Mitsuaki Izuha

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and penetrating electrode testing method
- Patent number 8,691,601
- Issue date Apr 8, 2014
- Sony Corporation
- Mitsuaki Izuha
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor device and penetrating electrode testing method
- Publication number 20110204357
- Publication date Aug 25, 2011
- SONY CORPORATION
- Mitsuaki Izuha
- G01 - MEASURING TESTING