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Mitsuaki Kameyama

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  • Takamatsu City, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Thickness-measuring device
    • Patent number 6,618,464
    • Issue date Sep 9, 2003
    • Futec Inc.
    • Kiyoshi Mizobuchi
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Thickness-measuring device
    • Publication number 20020141534
    • Publication date Oct 3, 2002
    • Kiyoshi Mizobuchi
    • G01 - MEASURING TESTING