Mitsuhide Matsushita

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Electron microscope
- Patent number 6,841,775
- Issue date Jan 11, 2005
- Jeol Ltd.
- Yukihito Kondo
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Charged Particle Beam Instrument
- Publication number 20140209193
- Publication date Jul 31, 2014
- Mitsuhide Matsushita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron microscope
- Publication number 20040031921
- Publication date Feb 19, 2004
- JEOL Ltd.
- Yukihito Kondo
- H01 - BASIC ELECTRIC ELEMENTS