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Mitsuhiko Nagata
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Fujisawa, JP
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last 30 patents
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Patent Grant
Thermal conductivity measuring device
Patent number
5,756,878
Issue date
May 26, 1998
Yamatake - Honeywell Co., Ltd.
Hiroyuki Muto
G01 - MEASURING TESTING
Information
Patent Grant
Method of correcting temperature characteristics of flow velocity s...
Patent number
5,321,983
Issue date
Jun 21, 1994
Yamatake - Honeywell Co., Ltd.
Mitsuhiko Nagata
G01 - MEASURING TESTING
Information
Patent Grant
Thermal conductivity detector
Patent number
5,295,389
Issue date
Mar 22, 1994
Yamatake Honeywell Co., Ltd.
Mitsuhiko Nagata
G01 - MEASURING TESTING
Information
Patent Grant
Diaphragm-type sensor
Patent number
5,291,781
Issue date
Mar 8, 1994
Yamatake Honeywell Co., Ltd.
Mitsuhiko Nagata
G01 - MEASURING TESTING