Mitsuhiro Hamada

Follow

Person

Hyogo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor inspecting system for inspecting a semiconductor inte...
- Patent number 6,750,672
- Issue date Jun 15, 2004
- Renesas Technology Corp.
- Masaaki Tanimura
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus for semiconductor memory device
- Patent number 6,535,993
- Issue date Mar 18, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Mitsuhiro Hamada
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device enabling test of timing standard for st...
- Patent number 6,339,555
- Issue date Jan 15, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Mitsuhiro Hamada
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device capable of reducing cost of analysis for findi...
- Patent number 6,297,997
- Issue date Oct 2, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Jun Ohtani
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor inspecting system for inspecting a semiconductor inte...
- Publication number 20030016045
- Publication date Jan 23, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Masaaki Tanimura
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor memory device enabling test of timing standard for st...
- Publication number 20020009004
- Publication date Jan 24, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Mitsuhiro Hamada
- G11 - INFORMATION STORAGE