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Mitsuhiro Ikeda
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Hyogo, JP
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last 30 patents
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Patent Grant
Secondary cell and method for testing secondary cell
Patent number
9,214,703
Issue date
Dec 15, 2015
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Mitsuhiro Ikeda
G01 - MEASURING TESTING
Information
Patent Grant
Substrate support jig, circuit board production apparatus, and meth...
Patent number
7,517,419
Issue date
Apr 14, 2009
Panasonic Corporation
Tatsuki Nogiwa
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Patents Applications
last 30 patents
Information
Patent Application
SECONDARY CELL AND METHOD FOR TESTING SECONDARY CELL
Publication number
20130127473
Publication date
May 23, 2013
PANASONIC CORPORATION
Mitsuhiro Ikeda
G01 - MEASURING TESTING
Information
Patent Application
Substrate support jig, circuit board production apparatus, and meth...
Publication number
20050230050
Publication date
Oct 20, 2005
Tatsuki Nogiwa
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR