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Mitsuhiro Ishihara
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Aichi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Workpiece inspection apparatus
Patent number
11,915,955
Issue date
Feb 27, 2024
TAKAOKA TOKO CO., LTD.
Mitsuhiro Ishihara
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Focus position changing apparatus and confocal optical apparatus us...
Patent number
9,435,982
Issue date
Sep 6, 2016
TAKAOKA TOKO CO., LTD.
Mitsuhiro Ishihara
G02 - OPTICS
Information
Patent Grant
Continuous scan type measuring apparatus
Patent number
9,341,469
Issue date
May 17, 2016
TAKAOKA TOKO CO., LTD.
Mitsuhiro Ishihara
G01 - MEASURING TESTING
Information
Patent Grant
Three-dimensional shape measuring apparatus
Patent number
9,041,940
Issue date
May 26, 2015
TAKAOKA TOKO CO., LTD.
Mitsuhiro Ishihara
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
CONTINUOUS SCAN TYPE MEASURING APPARATUS
Publication number
20150204660
Publication date
Jul 23, 2015
TAKAOKA TOKO CO., LTD.
Mitsuhiro ISHIHARA
G01 - MEASURING TESTING
Information
Patent Application
Polarization bearing detection type two-dimensional light reception...
Publication number
20040257565
Publication date
Dec 23, 2004
Mitsuhiro Ishihara
G01 - MEASURING TESTING