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Mitsuhiro Kondo
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Nagano, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Probe unit
Patent number
9,702,905
Issue date
Jul 11, 2017
NHK Spring Co., Ltd.
Yoshio Yamada
G01 - MEASURING TESTING
Information
Patent Grant
Probe-unit base member and probe unit
Patent number
8,633,724
Issue date
Jan 21, 2014
NHK Spring Co., Ltd.
Toshio Kazama
G01 - MEASURING TESTING
Information
Patent Grant
Conductive contact holder and conductive contact unit
Patent number
8,096,840
Issue date
Jan 17, 2012
NHK Spring Co., Ltd.
Kohei Hironaka
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
PROBE UNIT
Publication number
20140247065
Publication date
Sep 4, 2014
NHK Spring Co., Ltd.
Yoshio Yamada
G01 - MEASURING TESTING
Information
Patent Application
PROBE-UNIT BASE MEMBER AND PROBE UNIT
Publication number
20110227596
Publication date
Sep 22, 2011
NHK Spring Co., Ltd.
Toshio Kazama
G01 - MEASURING TESTING
Information
Patent Application
CONDUCTIVE CONTACT HOLDER AND CONDUCTIVE CONTACT UNIT
Publication number
20100184306
Publication date
Jul 22, 2010
NHK Spring Co., Ltd.
Kohei Hironaka
G01 - MEASURING TESTING