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Mitsuhiro Matsuda
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Kumamoto-shi, JP
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last 30 patents
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Patent Grant
Micromaterial strain measurement apparatus and method therefor
Patent number
8,844,367
Issue date
Sep 30, 2014
Kumamoto University
Kazuki Takashima
G01 - MEASURING TESTING
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last 30 patents
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MICROMATERIAL STRAIN MEASUREMENT APPARATUS AND METHOD THEREFOR TECH...
Publication number
20130068034
Publication date
Mar 21, 2013
SIGMA KOKI CO., LTD
Kazuki Takashima
G01 - MEASURING TESTING