Mitsuhiro Matsushima

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Patents Grantslast 30 patents

Information Patent Grant
Inspection device and system for inspecting foreign matters in a li...
- Patent number 6,937,339
- Issue date Aug 30, 2005
- Hitachi Engineering Co., Ltd.
- Hiromi Yamazaki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Inspection device and system for inspecting foreign matters in liqu...
- Publication number 20020171054
- Publication date Nov 21, 2002
- Hiromi Yamazaki
- G01 - MEASURING TESTING