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Mitsuhiro Nagashima
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Tokyo, JP
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last 30 patents
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Patent Grant
Method for manufacturing thermal-type infrared sensor
Patent number
5,966,590
Issue date
Oct 12, 1999
Director General, Technical Research and Development Institute, Japan Defense...
Hideo Wada
G01 - MEASURING TESTING
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Patent Grant
VOX film, wherein X is greater than 1.875 and less than 2.0, and a...
Patent number
5,801,383
Issue date
Sep 1, 1998
Masahiro Ota, Director General, Technical Research and Development Institute,...
Hideo Wada
G01 - MEASURING TESTING