TREA

Mitsuhiro Nagaya

Follow

Person

  • Nagano, JP
People

Patents Grantslast 30 patents

  • Information Patent Grant

    Probe card for a semiconductor wafer
    • Patent number 8,456,184
    • Issue date Jun 4, 2013
    • NHK Spring Co., Ltd.
    • Yoshio Yamada
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe card
    • Patent number 8,149,006
    • Issue date Apr 3, 2012
    • NHK Spring Co., Ltd.
    • Hiroshi Nakayama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Parallelism adjusting mechanism of probe card
    • Patent number 8,049,525
    • Issue date Nov 1, 2011
    • NHK Spring Co., Ltd.
    • Yoshio Yamada
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe card
    • Patent number 8,018,242
    • Issue date Sep 13, 2011
    • NHK Spring Co., Ltd.
    • Hiroshi Nakayama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe card
    • Patent number 7,898,272
    • Issue date Mar 1, 2011
    • NHK Spring Co., Ltd.
    • Shunsuke Sasaki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Probe card
    • Patent number 7,795,892
    • Issue date Sep 14, 2010
    • NHK Spring Co., Ltd.
    • Yoshio Yamada
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Conductive contact holder and conductive contact unit
    • Patent number 7,785,147
    • Issue date Aug 31, 2010
    • NHK Spring Co., Ltd.
    • Hiroshi Nakayama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Holder for conductive contact
    • Patent number 7,239,158
    • Issue date Jul 3, 2007
    • NHK Spring Co., Ltd.
    • Toshio Kazama
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    PROBE CARD
    • Publication number 20100164518
    • Publication date Jul 1, 2010
    • NHK Spring Co., Ltd.
    • Yoshio Yamada
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe Card
    • Publication number 20100052707
    • Publication date Mar 4, 2010
    • NHK Spring Co.,Ltd
    • Hiroshi Nakayama
    • G01 - MEASURING TESTING
  • Information Patent Application

    PARALLELISM ADJUSTING MECHANISM OF PROBE CARD
    • Publication number 20100001752
    • Publication date Jan 7, 2010
    • NHK SPRING CO., LTD.
    • Yoshio Yamada
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe Card
    • Publication number 20100001748
    • Publication date Jan 7, 2010
    • NHK Spring Co., Ltd.
    • Shunsuke Sasaki
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe Card
    • Publication number 20090219043
    • Publication date Sep 3, 2009
    • NHK SPRING CO., LTD.
    • Hiroshi Nakayama
    • G01 - MEASURING TESTING
  • Information Patent Application

    Conductive Contact Holder and Conductive Contact Unit
    • Publication number 20090221186
    • Publication date Sep 3, 2009
    • NHK SPRING CO., LTD.
    • Hiroshi Nakayama
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe Card
    • Publication number 20090167335
    • Publication date Jul 2, 2009
    • NHK Spring Co., Ltd.
    • Yoshio Yamada
    • G01 - MEASURING TESTING
  • Information Patent Application

    Holder for conductive contact
    • Publication number 20050225313
    • Publication date Oct 13, 2005
    • Toshio Kazama
    • G01 - MEASURING TESTING