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Mitsuhiro Oki
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Yokohama-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Molecular detection apparatus and molecular detection method
Patent number
11,567,023
Issue date
Jan 31, 2023
Kabushiki Kaisha Toshiba
Hirohisa Miyamoto
G01 - MEASURING TESTING
Information
Patent Grant
Molecular detection apparatus and molecular detection method
Patent number
11,353,434
Issue date
Jun 7, 2022
Kabushiki Kaisha Toshiba
Mitsuhiro Oki
G01 - MEASURING TESTING
Information
Patent Grant
Molecular detection apparatus and molecular detection method
Patent number
10,761,051
Issue date
Sep 1, 2020
Kabushiki Kaisha Toshiba
Ko Yamada
G01 - MEASURING TESTING
Information
Patent Grant
Molecular detection apparatus and molecular detection method
Patent number
10,761,050
Issue date
Sep 1, 2020
Kabushiki Kaisha Toshiba
Ko Yamada
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Molecular detection apparatus, molecular detection method, and mole...
Patent number
10,677,770
Issue date
Jun 9, 2020
Kabushiki Kaisha Toshiba
Ko Yamada
G01 - MEASURING TESTING
Information
Patent Grant
Molecular detection apparatus, molecular detection method, and orga...
Patent number
10,527,581
Issue date
Jan 7, 2020
Kabushiki Kaisha Toshiba
Ko Yamada
G01 - MEASURING TESTING
Information
Patent Grant
Electrode material for nonaqueous electrolyte secondary battery, el...
Patent number
9,859,552
Issue date
Jan 2, 2018
Kabushiki Kaisha Toshiba
Takayuki Fukasawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Gas detection apparatus
Patent number
9,709,523
Issue date
Jul 18, 2017
Kabushiki Kaisha Toshiba
Norikazu Osada
G01 - MEASURING TESTING
Information
Patent Grant
Method of quantitative analysis of hexavalent chromium in chromate...
Patent number
9,261,493
Issue date
Feb 16, 2016
Kabushiki Kaisha Toshiba
Tetsuya Tachibe
G01 - MEASURING TESTING
Information
Patent Grant
Joint with first and second members with a joining layer located th...
Patent number
8,763,884
Issue date
Jul 1, 2014
Kabushiki Kaisha Toshiba
Toshihide Takahashi
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Method for extracting hexavalent chromium in a polymer material
Patent number
8,628,600
Issue date
Jan 14, 2014
Kabushiki Kaisha Toshiba
Miho Muramatsu
C01 - INORGANIC CHEMISTRY
Information
Patent Grant
Method of quantitative analysis of hexavalent chromium in chromate...
Patent number
8,223,917
Issue date
Jul 17, 2012
Kabushiki Kaisha Toshiba
Mitsuhiro Oki
G01 - MEASURING TESTING
Information
Patent Grant
Method for analyzing antimony contained in glass
Patent number
8,114,672
Issue date
Feb 14, 2012
Kabushiki Kaisha Toshiba
Sayaka Morimoto
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD OF ANALYZING ANTIMONY ION, INSPECTION TOOL USED FOR ANALYZIN...
Publication number
20230296527
Publication date
Sep 21, 2023
Kabushiki Kaisha Toshiba
Mitsuhiro OKI
G01 - MEASURING TESTING
Information
Patent Application
MOLECULAR DETECTION APPARATUS AND MOLECULAR DETECTION METHOD
Publication number
20190293588
Publication date
Sep 26, 2019
KABUSHIKI KAISHA TOSHIBA
Hirohisa MIYAMOTO
G01 - MEASURING TESTING
Information
Patent Application
MOLECULAR DETECTION APPARATUS AND METHOD OF DETECTING MOLECULES
Publication number
20190086327
Publication date
Mar 21, 2019
KABUSHIKI KAISHA TOSHIBA
Masaki Atsuta
G01 - MEASURING TESTING
Information
Patent Application
MOLECULAR DETECTION APPARATUS AND MOLECULAR DETECTION METHOD
Publication number
20190086359
Publication date
Mar 21, 2019
KABUSHIKI KAISHA TOSHIBA
Ko Yamada
G01 - MEASURING TESTING
Information
Patent Application
MOLECULAR DETECTION APPARATUS AND MOLECULAR DETECTION METHOD
Publication number
20180275105
Publication date
Sep 27, 2018
KABUSHIKI KAISHA TOSHIBA
Mitsuhiro Oki
G01 - MEASURING TESTING
Information
Patent Application
MOLECULAR DETECTION APPARATUS, MOLECULAR DETECTION METHOD, AND MOLE...
Publication number
20180080911
Publication date
Mar 22, 2018
KABUSHIKI KAISHA TOSHIBA
Ko YAMADA
G01 - MEASURING TESTING
Information
Patent Application
MOLECULAR DETECTION APPARATUS, MOLECULAR DETECTION METHOD, AND ORGA...
Publication number
20180059053
Publication date
Mar 1, 2018
KABUSHIKI KAISHA TOSHIBA
Ko YAMADA
G01 - MEASURING TESTING
Information
Patent Application
MOLECULAR DETECTION APPARATUS AND MOLECULAR DETECTION METHOD
Publication number
20170350854
Publication date
Dec 7, 2017
KABUSHIKI KAISHA TOSHIBA
Ko YAMADA
G01 - MEASURING TESTING
Information
Patent Application
MOLECULAR DETECTION APPARATUS AND MOLECULAR DETECTION METHOD
Publication number
20170248566
Publication date
Aug 31, 2017
KABUSHIKI KAISHA TOSHIBA
Ko YAMADA
G01 - MEASURING TESTING
Information
Patent Application
MOLECULAR DETECTION APPARATUS AND MOLECULAR DETECTION METHOD
Publication number
20170248565
Publication date
Aug 31, 2017
KABUSHIKI KAISHA TOSHIBA
Ko YAMADA
G01 - MEASURING TESTING
Information
Patent Application
ELECTRODE MATERIAL FOR NONAQUEOUS ELECTROLYTE SECONDARY BATTERY, E...
Publication number
20150086870
Publication date
Mar 26, 2015
Kabushiki Kaisha Toshiba
Takayuki FUKASAWA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
JOINT WITH FIRST AND SECOND MEMBERS WITH A JOINING LAYER LOCATED TH...
Publication number
20140008419
Publication date
Jan 9, 2014
Kabushiki Kaisha Toshiba
Toshihide Takahashi
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
METHOD OF QUANTITATIVE ANALYSIS OF HEXAVALENT CHROMIUM IN CHROMATE...
Publication number
20120264225
Publication date
Oct 18, 2012
Mitsuhiro OKI
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR EXTRACTING HEXAVALENT CHROMIUM IN A POLYMER MATERIAL
Publication number
20120137830
Publication date
Jun 7, 2012
Kabushiki Kaisha Toshiba
Miho Muramatsu
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR ANALYZING ANTIMONY CONTAINED IN GLASS
Publication number
20110217782
Publication date
Sep 8, 2011
Kabushiki Kaisha Toshiba
Sayaka Morimoto
G01 - MEASURING TESTING
Information
Patent Application
JOINT WITH FIRST AND SECOND MEMBERS WITH A JOINING LAYER LOCATED TH...
Publication number
20100247955
Publication date
Sep 30, 2010
KABUSHIKI KAISHA TOSHIBA
Toshihide Takahashi
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
METHOD OF QUANTITATIVE ANALYSIS OF HEXAVALENT CHROMIUM IN CHROMATE...
Publication number
20100091944
Publication date
Apr 15, 2010
Mitsuhiro OKI
G01 - MEASURING TESTING
Information
Patent Application
DETECTOR AND PRODUCTION METHOD THEREOF
Publication number
20080250847
Publication date
Oct 16, 2008
Kabushiki Kaisha Toshiba
Tomoyuki KITANI
G01 - MEASURING TESTING
Information
Patent Application
Method of quantitative analysis of hexavalent chromium in chromate...
Publication number
20070048873
Publication date
Mar 1, 2007
KABUSHIKI KAISHA TOSHIBA
Tetsuya Tachibe
G01 - MEASURING TESTING