Mitsuhisa Nakano

Follow

Person

Nagoya-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Contour measuring apparatus
- Patent number 9,291,442
- Issue date Mar 22, 2016
- Mitutoyo Corporation
- Hiroyuki Hidaka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CONTOUR MEASURING APPARATUS
- Publication number 20140283402
- Publication date Sep 25, 2014
- Mitutoyo Corporation
- Hiroyuki Hidaka
- G01 - MEASURING TESTING