Mitsuhisa SATO

Person

  • Tokyo, JP

Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    SEMICONDUCTOR TESTING SYSTEM

    • Publication number 20080189585
    • Publication date Aug 7, 2008
    • YOKOGAWA ELECTRIC CORPORATION
    • Mitsuhisa SATO
    • G01 - MEASURING TESTING