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Mitsuhito Kamei

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  • Hyogo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Gas sensor
    • Patent number 5,876,578
    • Issue date Mar 2, 1999
    • Mitsubishi Denki Kabushiki Kaisha
    • Shiro Yamauchi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Surface undulation inspection apparatus
    • Patent number 5,309,222
    • Issue date May 3, 1994
    • Mitsubishi Denki Kabushiki Kaisha
    • Mitsuhito Kamei
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Heterodyne interferometer
    • Patent number 5,305,084
    • Issue date Apr 19, 1994
    • Mitsubishi Denki Kabushiki Kaisha
    • Hiroshi Doi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Screw surface flaw inspection method and an apparatus therefor
    • Patent number 4,598,998
    • Issue date Jul 8, 1986
    • Sumitomo Kinzoku Kogyo Kabushiki Kaisha
    • Mitsuhito Kamei
    • G01 - MEASURING TESTING