Mitsuji Ikeda

Person

Hitachinaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Pattern matching device and computer program for pattern matching
- Patent number 11,669,953
- Issue date Jun 6, 2023
- HITACHI HIGH-TECH CORPORATION
- Wataru Nagatomo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern matching apparatus and computer program
- Patent number 10,535,129
- Issue date Jan 14, 2020
- Hitachi High-Technologies Corporation
- Masahiro Kitazawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image processing apparatus, distortion-corrected map creation appar...
- Patent number 9,514,528
- Issue date Dec 6, 2016
- Hitachi High-Technologies Corporation
- Junichi Taguchi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Device and method for detecting angle of rotation from normal posit...
- Patent number 9,514,526
- Issue date Dec 6, 2016
- Hitachi High-Technologies Corporation
- Jun'ichi Taguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection apparatus
- Patent number 9,183,450
- Issue date Nov 10, 2015
- Hitachi High-Technologies Corporation
- Yuichi Abe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern matching method, image processing device, and computer program
- Patent number 9,141,879
- Issue date Sep 22, 2015
- Hitachi High-Technologies Corporation
- Hiroyuki Ushiba
- G01 - MEASURING TESTING
Information Patent Grant
Template matching processing device and template matching processin...
- Patent number 8,971,627
- Issue date Mar 3, 2015
- Hitachi High-Technologies Corporation
- Jun'ichi Taguchi
- G01 - MEASURING TESTING
Information Patent Grant
Pattern matching method and image processing device
- Patent number 8,953,894
- Issue date Feb 10, 2015
- Hitachi High-Technologies Corporation
- Yoshimichi Sato
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern matching method and pattern matching apparatus
- Patent number 8,885,950
- Issue date Nov 11, 2014
- Hitachi High-Technologies Corporation
- Wataru Nagatomo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern measuring apparatus
- Patent number 8,872,106
- Issue date Oct 28, 2014
- Hitachi High-Technologies Corporation
- Hiroshi Nishihama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern measuring apparatus
- Patent number 8,618,517
- Issue date Dec 31, 2013
- Hitachi High-Technologies Corporation
- Hiroshi Nishihama
Information Patent Grant
Image inspection apparatus
- Patent number 8,498,489
- Issue date Jul 30, 2013
- Hitachi High-Technologies Corporation
- Yuichi Abe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 8,335,397
- Issue date Dec 18, 2012
- Hitachi High-Technologies Corporation
- Atsushi Takane
- G01 - MEASURING TESTING
Information Patent Grant
Image processing system and scanning electron microscope
- Patent number 8,305,435
- Issue date Nov 6, 2012
- Hitachi High-Technologies Corporation
- Yoshimichi Sato
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for computing degree of matching
- Patent number 8,285,056
- Issue date Oct 9, 2012
- Hitachi High-Technologies Corporation
- Junichi Taguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 8,263,935
- Issue date Sep 11, 2012
- Hitachi High-Technologies Corporation
- Atsushi Takane
- G01 - MEASURING TESTING
Information Patent Grant
Image processing apparatus for analysis of pattern matching failure
- Patent number 8,200,006
- Issue date Jun 12, 2012
- Hitachi High-Technologies Corporation
- Mitsuji Ikeda
- G01 - MEASURING TESTING
Information Patent Grant
Image processing method for determining matching position between t...
- Patent number 8,139,868
- Issue date Mar 20, 2012
- Hitachi High-Technologies Corporation
- Yuichi Abe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern matching apparatus and scanning electron microscope using t...
- Patent number 8,041,104
- Issue date Oct 18, 2011
- Hitachi High-Technologies Corporation
- Yasutaka Toyoda
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, method and program product for matching with a template
- Patent number 8,019,164
- Issue date Sep 13, 2011
- Hitachi High-Technologies Corporation
- Junichi Taguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection apparatus using template matching method using similarit...
- Patent number 7,925,076
- Issue date Apr 12, 2011
- Hitachi High-Technologies Corporation
- Yuichi Abe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 7,652,249
- Issue date Jan 26, 2010
- Hitachi High-Technologies Corporation
- Atsushi Takane
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 7,642,514
- Issue date Jan 5, 2010
- Hitachi, Ltd.
- Atsushi Takane
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image processing apparatus for analysis of pattern matching failure
- Patent number 7,545,977
- Issue date Jun 9, 2009
- Hitachi High-Technologies Corporation
- Mitsuji Ikeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 7,329,868
- Issue date Feb 12, 2008
- Hitachi, Ltd.
- Atsushi Takane
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor inspection system
- Patent number 7,235,782
- Issue date Jun 26, 2007
- Hitachi, Ltd.
- Atsushi Takane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for measuring three-dimensional shape of speci...
- Patent number 7,230,243
- Issue date Jun 12, 2007
- Hitachi High-Technologies Corporation
- Maki Tanaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 7,109,485
- Issue date Sep 19, 2006
- Hitachi, Ltd.
- Atsushi Takane
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Statistic calculating method using a template and corresponding sub...
- Patent number 7,082,224
- Issue date Jul 25, 2006
- Hitachi, Ltd.
- Mitsuji Ikeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Shape measuring device and shape measuring method
- Patent number 7,078,688
- Issue date Jul 18, 2006
- Hitachi High-Technologies Corporation
- Masato Kazui
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TRAINING METHOD AND DEVICE FOR MACHINE LEARNING MODEL
- Publication number 20240327775
- Publication date Oct 3, 2024
- HITACHI HIGH-TECH CORPORATION
- Mitsuji IKEDA
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
Localization Apparatus and Method
- Publication number 20240177333
- Publication date May 30, 2024
- Hitachi High-Tech Corporation
- Mitsuji IKEDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MACHINE LEARNING SYSTEM AND MACHINE LEARNING METHOD
- Publication number 20230229965
- Publication date Jul 20, 2023
- HITACHI HIGH-TECH CORPORATION
- Masayoshi ISHIKAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MACHINE LEARNING METHOD AND INFORMATION PROCESSING APPARATUS FOR MA...
- Publication number 20230080978
- Publication date Mar 16, 2023
- HITACHI HIGH-TECH CORPORATION
- Haruhiko HIGUCHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Machine Learning System
- Publication number 20220374785
- Publication date Nov 24, 2022
- HITACHI HIGH-TECH CORPORATION
- Masayoshi ISHIKAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern Matching Device and Computer Program for Pattern Matching
- Publication number 20180005363
- Publication date Jan 4, 2018
- Hitachi High-Technologies Corporation
- Wataru NAGATOMO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE PROCESSING APPARATUS, DISTORTION-CORRECTED MAP CREATION APPAR...
- Publication number 20140341461
- Publication date Nov 20, 2014
- Hitachi, High-Technologies Corporation
- Junichi Taguchi
- G01 - MEASURING TESTING
Information Patent Application
PATTERN MEASURING APPARATUS
- Publication number 20140021350
- Publication date Jan 23, 2014
- Hitachi High-Technologies Corporation
- Hiroshi Nishihama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PATTERN MEASURING APPARATUS
- Publication number 20140021349
- Publication date Jan 23, 2014
- Hitachi High-Technologies Corporation
- Hiroshi Nishihama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PATTERN MATCHING APPARATUS AND COMPUTER PROGRAM
- Publication number 20140023265
- Publication date Jan 23, 2014
- Masahiro Kitazawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEVICE AND METHOD FOR DETECTING ANGLE OF ROTATION FROM NORMAL POSIT...
- Publication number 20140016824
- Publication date Jan 16, 2014
- Hitachi High-Technologies Corporation
- Jun'ichi Taguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN MATCHING METHOD, IMAGE PROCESSING DEVICE, AND COMPUTER PROGRAM
- Publication number 20130216141
- Publication date Aug 22, 2013
- Hitachi High-Technologies Corporation
- Hiroyuki Ushiba
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CREATING TEMPLATE FOR PATTERNMATCHING, AND IMAGE PROCESS...
- Publication number 20130170757
- Publication date Jul 4, 2013
- Hitachi High-Technologies Corporation
- Shinichi Shinoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEMPLATE MATCHING PROCESSING DEVICE AND TEMPLATE MATCHING PROCESSIN...
- Publication number 20130114898
- Publication date May 9, 2013
- Hitachi High-Technologies Corporation
- Jun'ichi Taguchi
- G01 - MEASURING TESTING
Information Patent Application
Pattern Matching Method and Pattern Matching Apparatus
- Publication number 20120207397
- Publication date Aug 16, 2012
- Hitachi High-Technologies Corporation
- Wataru Nagatomo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern Matching Method, Pattern Matching Program, Electronic Compu...
- Publication number 20120182415
- Publication date Jul 19, 2012
- Hitachi High-Technologies Corporation
- Yasutaka Toyoda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN MATCHING METHOD AND IMAGE PROCESSING DEVICE
- Publication number 20110262043
- Publication date Oct 27, 2011
- Yoshimichi Sato
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT REVIEW DEVICE, DEFECT REVIEW METHOD, AND DEFECT REVIEW EXECU...
- Publication number 20110129140
- Publication date Jun 2, 2011
- Masahiro Kitazawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE INSPECTION APPARATUS
- Publication number 20110110597
- Publication date May 12, 2011
- Yuichi Abe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20100102224
- Publication date Apr 29, 2010
- Hitachi High-Technologies Corporation
- Atsushi TAKANE
- G01 - MEASURING TESTING
Information Patent Application
Image Processing System and Scanning Electron Microscope
- Publication number 20090295914
- Publication date Dec 3, 2009
- Hitachi High-Technologies Corporation
- Yoshimichi SATO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR COMPUTING DEGREE OF MATCHING
- Publication number 20090232405
- Publication date Sep 17, 2009
- Junichi Taguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Image processing apparatus for analysis of pattern matching failure
- Publication number 20090214122
- Publication date Aug 27, 2009
- Hitachi High-Technologies Corporation
- Mitsuji Ikeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspection Apparatus and Method
- Publication number 20090087103
- Publication date Apr 2, 2009
- Hitachi High-Technologies Corporation
- Yuichi Abe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DATA MANAGEMENT EQUIPMENT USED TO DEFECT REVIEW EQUIPMENT AND TESTI...
- Publication number 20090074286
- Publication date Mar 19, 2009
- Hitachi High-Technologies Corporation
- Masahiro KITAZAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20080292199
- Publication date Nov 27, 2008
- Hitachi High-Technologies Corporation
- Atsushi Takane
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Apparatus, method and program product for matching with a template
- Publication number 20080205769
- Publication date Aug 28, 2008
- Junichi Taguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Charged particle beam apparatus
- Publication number 20080116376
- Publication date May 22, 2008
- Hitachi, Ltd
- Atsushi Takane
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Charged particle beam apparatus
- Publication number 20080073526
- Publication date Mar 27, 2008
- Atsushi Takane
- G01 - MEASURING TESTING
Information Patent Application
Inspection Apparatus Using Template Matching Method Using Similarit...
- Publication number 20080069453
- Publication date Mar 20, 2008
- Hitachi High-Technologies Corporation
- Yuichi Abe
- G06 - COMPUTING CALCULATING COUNTING

Mitsuji Ikeda

Person

Patents Grantslast 30 patents

Pattern matching device and computer program for pattern matching

Pattern matching apparatus and computer program

Image processing apparatus, distortion-corrected map creation appar...

Device and method for detecting angle of rotation from normal posit...

Inspection apparatus

Pattern matching method, image processing device, and computer program

Template matching processing device and template matching processin...

Pattern matching method and image processing device

Pattern matching method and pattern matching apparatus

Pattern measuring apparatus

Pattern measuring apparatus

Image inspection apparatus

Charged particle beam apparatus

Image processing system and scanning electron microscope

Method and apparatus for computing degree of matching

Charged particle beam apparatus

Image processing apparatus for analysis of pattern matching failure

Image processing method for determining matching position between t...

Pattern matching apparatus and scanning electron microscope using t...

Apparatus, method and program product for matching with a template

Inspection apparatus using template matching method using similarit...

Charged particle beam apparatus

Charged particle beam apparatus

Image processing apparatus for analysis of pattern matching failure

Charged particle beam apparatus

Semiconductor inspection system

Method and apparatus for measuring three-dimensional shape of speci...

Charged particle beam apparatus

Statistic calculating method using a template and corresponding sub...

Shape measuring device and shape measuring method

Patents Applicationslast 30 patents

TRAINING METHOD AND DEVICE FOR MACHINE LEARNING MODEL

Localization Apparatus and Method

MACHINE LEARNING SYSTEM AND MACHINE LEARNING METHOD

MACHINE LEARNING METHOD AND INFORMATION PROCESSING APPARATUS FOR MA...

Machine Learning System

Pattern Matching Device and Computer Program for Pattern Matching

IMAGE PROCESSING APPARATUS, DISTORTION-CORRECTED MAP CREATION APPAR...

PATTERN MEASURING APPARATUS

PATTERN MEASURING APPARATUS

PATTERN MATCHING APPARATUS AND COMPUTER PROGRAM

DEVICE AND METHOD FOR DETECTING ANGLE OF ROTATION FROM NORMAL POSIT...

PATTERN MATCHING METHOD, IMAGE PROCESSING DEVICE, AND COMPUTER PROGRAM

METHOD FOR CREATING TEMPLATE FOR PATTERNMATCHING, AND IMAGE PROCESS...

TEMPLATE MATCHING PROCESSING DEVICE AND TEMPLATE MATCHING PROCESSIN...

Pattern Matching Method and Pattern Matching Apparatus

Pattern Matching Method, Pattern Matching Program, Electronic Compu...

PATTERN MATCHING METHOD AND IMAGE PROCESSING DEVICE

DEFECT REVIEW DEVICE, DEFECT REVIEW METHOD, AND DEFECT REVIEW EXECU...

IMAGE INSPECTION APPARATUS

CHARGED PARTICLE BEAM APPARATUS

Image Processing System and Scanning Electron Microscope

METHOD AND APPARATUS FOR COMPUTING DEGREE OF MATCHING

Image processing apparatus for analysis of pattern matching failure

Inspection Apparatus and Method

DATA MANAGEMENT EQUIPMENT USED TO DEFECT REVIEW EQUIPMENT AND TESTI...

Charged Particle Beam Apparatus

Apparatus, method and program product for matching with a template

Charged particle beam apparatus

Charged particle beam apparatus

Inspection Apparatus Using Template Matching Method Using Similarit...