Mitsumasa Ikeuchi

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TOKYO, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method for analyzing silicon substrate
- Patent number 11,837,510
- Issue date Dec 5, 2023
- Kioxia Corporation
- Jiahong Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analysis system for online-transferred analysis sample
- Patent number 10,024,801
- Issue date Jul 17, 2018
- IAS Inc.
- Katsuhiko Kawabata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Substrate etching apparatus and substrate analysis method
- Patent number 9,741,627
- Issue date Aug 22, 2017
- IAS, INC
- Katsuhiko Kawabata
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR ANALYZING SILICON SUBSTRATE
- Publication number 20210118751
- Publication date Apr 22, 2021
- KIOXIA Corporation
- Jiahong Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM FOR ANALYZING ONLINE-TRANSFERRED ASSAY SAMPLES
- Publication number 20180024068
- Publication date Jan 25, 2018
- IAS Inc.
- Katsuhiko Kawabata
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE ETCHING APPARATUS AND SUBSTRATE ANALYSIS METHOD
- Publication number 20150357249
- Publication date Dec 10, 2015
- IAS Inc.
- Katsuhiko Kawabata
- H01 - BASIC ELECTRIC ELEMENTS