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Mitsunori AIZAWA
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Saitama, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Electronic component handling apparatus and electronic component te...
Patent number
11,353,502
Issue date
Jun 7, 2022
Advantest Corporation
Masataka Onozawa
G01 - MEASURING TESTING
Information
Patent Grant
Device holder, inner unit, outer unit, and tray
Patent number
9,874,605
Issue date
Jan 23, 2018
Advantest Corporation
Mitsunori Aizawa
G01 - MEASURING TESTING
Information
Patent Grant
Handler apparatus that conveys a device under test to a test socket...
Patent number
9,784,789
Issue date
Oct 10, 2017
Advantest Corporation
Aritomo Kikuchi
G01 - MEASURING TESTING
Information
Patent Grant
Handler apparatus, device holder, and test apparatus
Patent number
9,772,373
Issue date
Sep 26, 2017
Advantest Corporation
Mitsunori Aizawa
G01 - MEASURING TESTING
Information
Patent Grant
Handler apparatus, adjustment method of handler apparatus, and test...
Patent number
9,658,287
Issue date
May 23, 2017
Advantest Corporation
Tsuyoshi Yamashita
G01 - MEASURING TESTING
Information
Patent Grant
Handler apparatus that conveys a device under test to a test socket...
Patent number
9,606,170
Issue date
Mar 28, 2017
Advantest Corporation
Tsuyoshi Yamashita
G01 - MEASURING TESTING
Information
Patent Grant
Fixture unit, fixture apparatus, handler apparatus, and test apparatus
Patent number
9,506,948
Issue date
Nov 29, 2016
Advantest Corporation
Yuya Yamada
G01 - MEASURING TESTING
Information
Patent Grant
Handler apparatus and test method
Patent number
9,285,393
Issue date
Mar 15, 2016
Advantest Corporation
Hiroyuki Kikuchi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ELECTRONIC COMPONENT HANDLING APPARATUS AND ELECTRONIC COMPONENT TE...
Publication number
20210285999
Publication date
Sep 16, 2021
Advantest Corporation
Masataka Onozawa
G01 - MEASURING TESTING
Information
Patent Application
FIXTURE UNIT, FIXTURE APPARATUS, HANDLER APPARATUS, AND TEST APPARATUS
Publication number
20150276801
Publication date
Oct 1, 2015
Advantest Corporation
Yuya YAMADA
G01 - MEASURING TESTING
Information
Patent Application
Handler Apparatus and Test Apparatus
Publication number
20150276863
Publication date
Oct 1, 2015
Advantest Corporation
Tsuyoshi YAMASHITA
G01 - MEASURING TESTING
Information
Patent Application
Handler Apparatus and Test Apparatus
Publication number
20150276862
Publication date
Oct 1, 2015
Advantest Corporation
Aritomo KIKUCHI
G01 - MEASURING TESTING
Information
Patent Application
DEVICE HOLDER, INNER UNIT, OUTER UNIT, AND TRAY
Publication number
20150276859
Publication date
Oct 1, 2015
Advantest Corporation
Mitsunori AIZAWA
G01 - MEASURING TESTING
Information
Patent Application
HANDLER APPARATUS, DEVICE HOLDER, AND TEST APPARATUS
Publication number
20150276860
Publication date
Oct 1, 2015
Advantest Corporation
Mitsunori AIZAWA
G01 - MEASURING TESTING
Information
Patent Application
HANDLER APPARATUS, ADJUSTMENT METHOD OF HANDLER APPARATUS, AND TEST...
Publication number
20150276861
Publication date
Oct 1, 2015
Advantest Corporation
Tsuyoshi YAMASHITA
G01 - MEASURING TESTING
Information
Patent Application
HANDLER APPARATUS AND TEST METHOD
Publication number
20150137844
Publication date
May 21, 2015
Advantest Corporation
Hiroyuki KIKUCHI
G01 - MEASURING TESTING
Information
Patent Application
HANDLER APPARATUS AND TEST METHOD
Publication number
20130181733
Publication date
Jul 18, 2013
Advantest Corporation
Hiroyuki KIKUCHI
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC DEVICE PUSHING APPARATUS, ELECTRONIC DEVICE TEST APPARAT...
Publication number
20120112777
Publication date
May 10, 2012
Advantest Corporation
Mitsunori Aizawa
G01 - MEASURING TESTING
Information
Patent Application
Insert and Pusher of Electronic Device Handling Apparatus, Socket G...
Publication number
20070296419
Publication date
Dec 27, 2007
Advantest Corporation
Mitsunori Aizawa
G01 - MEASURING TESTING