Mitsunori Nishizawa

Person

Shizuoka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Time measurement device, time measurement method, light-emission-li...
- Patent number 10,962,932
- Issue date Mar 30, 2021
- Hamamatsu Photonics K.K.
- Ken Kitazawa
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Light source device and inspection device
- Patent number 10,408,874
- Issue date Sep 10, 2019
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device inspection device and semiconductor device ins...
- Patent number 10,191,104
- Issue date Jan 29, 2019
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image generation apparatus and image generation method
- Patent number 10,139,447
- Issue date Nov 27, 2018
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device inspection device and semiconductor device ins...
- Patent number 10,101,383
- Issue date Oct 16, 2018
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for frequency analyzing a measurement target and method o...
- Patent number 9,618,550
- Issue date Apr 11, 2017
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for testing a semiconductor device and method of testing...
- Patent number 9,618,576
- Issue date Apr 11, 2017
- Hamamatsu Photonics K.K.
- Akihiro Otaka
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device inspection device and semiconductor device ins...
- Patent number 9,618,563
- Issue date Apr 11, 2017
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device inspection device and semiconductor device ins...
- Patent number 9,562,944
- Issue date Feb 7, 2017
- Hamamatsu Photonics K.K.
- Tomonori Nakamura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-resolved measurement apparatus and position-sensitive election...
- Patent number 7,619,199
- Issue date Nov 17, 2009
- Hamamatsu Photonics K.K.
- Nobuyuki Hirai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-resolved measurement apparatus
- Patent number 7,425,694
- Issue date Sep 16, 2008
- Hamamatsu Photonics K.K.
- Mitsunori Nishizawa
- G01 - MEASURING TESTING
Information Patent Grant
Optical waveform detecting device
- Patent number 5,866,897
- Issue date Feb 2, 1999
- Hamamatsu Photonics K.K.
- Mitsunori Nishizawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Synchronous signal detection apparatus with a photoconductive photo...
- Patent number 5,591,962
- Issue date Jan 7, 1997
- Hamamatsu Photonics K.K.
- Musubu Koishi
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for driving a photoelectric device and a method for driving...
- Patent number 5,204,522
- Issue date Apr 20, 1993
- Hamamatsu Photonics K.K.
- Akira Takahashi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION DEVICE
- Publication number 20240012047
- Publication date Jan 11, 2024
- Hamamatsu Photonics K.K.
- Tomonori NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
LIGHT SOURCE DEVICE AND INSPECTION DEVICE
- Publication number 20180156860
- Publication date Jun 7, 2018
- Hamamatsu Photonics K.K.
- Tomonori NAKAMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME MEASUREMENT DEVICE, TIME MEASUREMENT METHOD, LIGHT-EMISSION-LI...
- Publication number 20170285579
- Publication date Oct 5, 2017
- Hamamatsu Photonics K.K.
- Ken KITAZAWA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE INSPECTION DEVICE AND SEMICONDUCTOR DEVICE INS...
- Publication number 20170176521
- Publication date Jun 22, 2017
- HAMAMATSU PHOTONICS K. K.
- Tomonori NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE INSPECTION DEVICE AND SEMICONDUCTOR DEVICE INS...
- Publication number 20160334459
- Publication date Nov 17, 2016
- HAMAMATSU PHOTONICS K. K.
- Tomonori NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE INSPECTION DEVICE AND SEMICONDUCTOR DEVICE INS...
- Publication number 20150377959
- Publication date Dec 31, 2015
- Hamamatsu Photonics K. K.
- Tomonori NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE INSPECTION DEVICE AND SEMICONDUCTOR DEVICE INS...
- Publication number 20150369755
- Publication date Dec 24, 2015
- Hamamatsu Photonics K.K.
- Tomonori NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
IMAGE GENERATION APPARATUS AND IMAGE GENERATION METHOD
- Publication number 20150309115
- Publication date Oct 29, 2015
- HAMAMATSU PHOTONICS K. K.
- Tomonori NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR TESTING A SEMICONDUCTOR DEVICE AND METHOD OF TESTING...
- Publication number 20150153408
- Publication date Jun 4, 2015
- HAMAMATSU PHOTONICS K. K.
- Akihiro OTAKA
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR FREQUENCY ANALYZING A MEASUREMENT TARGET AND METHOD O...
- Publication number 20150130474
- Publication date May 14, 2015
- HAMAMATSU PHOTONICS K. K.
- Tomonori NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
Time-Resolved Measurement Apparatus
- Publication number 20070267565
- Publication date Nov 22, 2007
- Mitsunori Nishizawa
- G01 - MEASURING TESTING
Information Patent Application
Time Resolution Measurement Device and Position Detection Election...
- Publication number 20070263223
- Publication date Nov 15, 2007
- Nobuyuki Hirai
- H01 - BASIC ELECTRIC ELEMENTS

Mitsunori Nishizawa

Person

Patents Grantslast 30 patents

Time measurement device, time measurement method, light-emission-li...

Light source device and inspection device

Semiconductor device inspection device and semiconductor device ins...

Image generation apparatus and image generation method

Semiconductor device inspection device and semiconductor device ins...

Apparatus for frequency analyzing a measurement target and method o...

Apparatus for testing a semiconductor device and method of testing...

Semiconductor device inspection device and semiconductor device ins...

Semiconductor device inspection device and semiconductor device ins...

Time-resolved measurement apparatus and position-sensitive election...

Time-resolved measurement apparatus

Optical waveform detecting device

Synchronous signal detection apparatus with a photoconductive photo...

Method for driving a photoelectric device and a method for driving...

Patents Applicationslast 30 patents

INSPECTION DEVICE

LIGHT SOURCE DEVICE AND INSPECTION DEVICE

TIME MEASUREMENT DEVICE, TIME MEASUREMENT METHOD, LIGHT-EMISSION-LI...

SEMICONDUCTOR DEVICE INSPECTION DEVICE AND SEMICONDUCTOR DEVICE INS...

SEMICONDUCTOR DEVICE INSPECTION DEVICE AND SEMICONDUCTOR DEVICE INS...

SEMICONDUCTOR DEVICE INSPECTION DEVICE AND SEMICONDUCTOR DEVICE INS...

SEMICONDUCTOR DEVICE INSPECTION DEVICE AND SEMICONDUCTOR DEVICE INS...

IMAGE GENERATION APPARATUS AND IMAGE GENERATION METHOD

APPARATUS FOR TESTING A SEMICONDUCTOR DEVICE AND METHOD OF TESTING...

APPARATUS FOR FREQUENCY ANALYZING A MEASUREMENT TARGET AND METHOD O...

Time-Resolved Measurement Apparatus

Time Resolution Measurement Device and Position Detection Election...