Mitsuo Hattori

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for searching electromagnetic disturbing sourc...
- Patent number 6,154,710
- Issue date Nov 28, 2000
- Nippon Telegraph & Telephone Corporation
- Ryuichi Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact voltage probe apparatus
- Patent number 5,949,230
- Issue date Sep 7, 1999
- Nippon Telegraph & Telephone Corporation
- Ryuichi Kobayashi
- G01 - MEASURING TESTING