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Mitsuo Hori
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Test apparatus, test method, electronic device manufacturing method...
Patent number
7,532,994
Issue date
May 12, 2009
Advantest Corporation
Hideki Tada
G01 - MEASURING TESTING
Information
Patent Grant
Test emulator, emulation program and method for manufacturing semic...
Patent number
7,506,291
Issue date
Mar 17, 2009
Advantest Corporation
Hideki Tada
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Test simulator, test simulation program and recording medium
Patent number
7,502,724
Issue date
Mar 10, 2009
Advantest Corporation
Hideki Tada
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Test program debugger device, semiconductor test apparatus, test pr...
Patent number
7,269,773
Issue date
Sep 11, 2007
Advantest Corporation
Mitsuo Hori
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
Test apparatus, test method, electronic device manufacturing method...
Publication number
20060247882
Publication date
Nov 2, 2006
Advantest Corporation
Hideki Tada
G01 - MEASURING TESTING
Information
Patent Application
Test program debugger device, semiconductor test apparatus, test pr...
Publication number
20060248390
Publication date
Nov 2, 2006
Advantest Corporation
Mitsuo Hori
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Test simulator, test simulation program and recording medium
Publication number
20060085682
Publication date
Apr 20, 2006
Advantest Corporation
Hideki Tada
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Test emulator, emulation program and method for manufacturing semic...
Publication number
20060064607
Publication date
Mar 23, 2006
Advantest Corporation
Hideki Tada
G06 - COMPUTING CALCULATING COUNTING