Mitsuo Koike

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Kamakura, JP

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Patents Grantslast 30 patents

Information Patent Grant
Sample processing method
- Patent number 8,716,681
- Issue date May 6, 2014
- Kabushiki Kaisha Toshiba
- Hitomi Kawaguchiya
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device
- Patent number 5,770,512
- Issue date Jun 23, 1998
- Kabushiki Kaisha Toshiba
- Atsushi Murakoshi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron-beam lithography system and method for drawing nanometer-o...
- Patent number 5,767,521
- Issue date Jun 16, 1998
- Kabushiki Kaisha Toshiba
- Shiro Takeno
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Semiconductor device
- Patent number 5,656,859
- Issue date Aug 12, 1997
- Kabushiki Kaisha Toshiba
- Atsushi Murakoshi
- H01 - BASIC ELECTRIC ELEMENTS