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Mitsuo Koizumi

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  • Yamagata-shi, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    IC test system
    • Patent number 10,527,669
    • Issue date Jan 7, 2020
    • HappyJapan, Inc.
    • Shouhei Matsumoto
    • G01 - MEASURING TESTING
  • Information Patent Grant

    IC handler
    • Patent number 10,222,413
    • Issue date Mar 5, 2019
    • HappyJapan Inc.
    • Shouhei Matsumoto
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    IC TEST SYSTEM
    • Publication number 20180267097
    • Publication date Sep 20, 2018
    • HAPPYJAPAN, INC.
    • Shouhei Matsumoto
    • G01 - MEASURING TESTING
  • Information Patent Application

    IC HANDLER
    • Publication number 20160356843
    • Publication date Dec 8, 2016
    • HAPPYJAPAN, INC.
    • Shouhei Matsumoto
    • G01 - MEASURING TESTING