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Mitsuo Kono
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Hiratsuka, JP
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last 30 patents
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Patent Grant
Method for fabricating an SOI substrate
Patent number
5,866,468
Issue date
Feb 2, 1999
Komatsu Electronic Metal Co., Ltd.
Mitsuo Kono
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for analysis of silicon wafers
Patent number
5,708,365
Issue date
Jan 13, 1998
Komatsu Electronic Metals Co., Ltd.
Shiro Yoshino
G01 - MEASURING TESTING
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Patent Grant
Process for preheat treatment of semiconductor wafers
Patent number
5,506,154
Issue date
Apr 9, 1996
Komatsu Electronic Metals Co., Ltd.
Hiroyuki Kawahara
H01 - BASIC ELECTRIC ELEMENTS