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Mitsuo Suga
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Kokubunji, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Specimen holder, specimen inspection apparatus, and specimen inspec...
Patent number
8,030,622
Issue date
Oct 4, 2011
Jeol Ltd.
Hidetoshi Nishiyama
G01 - MEASURING TESTING
Information
Patent Grant
Sample holder, method for observation and inspection, and apparatus...
Patent number
7,928,380
Issue date
Apr 19, 2011
Jeol Ltd.
Mitsuo Suga
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Inspection method and reagent solution
Patent number
7,906,760
Issue date
Mar 15, 2011
Jeol Ltd.
Hidetoshi Nishiyama
G01 - MEASURING TESTING
Information
Patent Grant
Method of inspecting pattern and inspecting instrument
Patent number
7,876,113
Issue date
Jan 25, 2011
Hitachi, Ltd.
Mari Nozoe
G01 - MEASURING TESTING
Information
Patent Grant
Charged-particle beam instrument
Patent number
7,202,476
Issue date
Apr 10, 2007
Jeol Ltd.
Mitsuo Suga
G01 - MEASURING TESTING
Information
Patent Grant
Method of inspecting pattern and inspecting instrument
Patent number
6,924,482
Issue date
Aug 2, 2005
Hitachi, Ltd.
Mari Nozoe
G01 - MEASURING TESTING
Information
Patent Grant
Method of inspecting pattern and inspecting instrument
Patent number
6,586,952
Issue date
Jul 1, 2003
Mari Nozoe
G01 - MEASURING TESTING
Information
Patent Grant
Superconducting device
Patent number
5,550,389
Issue date
Aug 27, 1996
Hitachi, Ltd.
Toshikazu Nishino
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Superconductive switching element with semiconductor channel
Patent number
5,250,506
Issue date
Oct 5, 1993
Hitachi, Ltd.
Shinichiroh Saitoh
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Sample Holder, Inspection Apparatus, and Inspection Method
Publication number
20110284745
Publication date
Nov 24, 2011
JEOL Ltd.
Hidetoshi Nishiyama
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and Method for Inspecting Samples
Publication number
20100243888
Publication date
Sep 30, 2010
JEOL Ltd.
Hidetoshi Nishiyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Specimen Holder, Specimen Inspection Apparatus, and Specimen Inspec...
Publication number
20100019146
Publication date
Jan 28, 2010
JEOL Ltd.
Hidetoshi Nishiyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Specimen Holder, Specimen Inspection Apparatus, and Specimen Inspec...
Publication number
20090314955
Publication date
Dec 24, 2009
JEOL Ltd.
Hidetoshi Nishiyama
G01 - MEASURING TESTING
Information
Patent Application
Inspection Method and Reagent Solution
Publication number
20090250609
Publication date
Oct 8, 2009
JEOL Ltd.
Hidetoshi Nishiyama
G01 - MEASURING TESTING
Information
Patent Application
Sample Holder, Method for Observation and Inspection, and Apparatus...
Publication number
20090166536
Publication date
Jul 2, 2009
JEOL Ltd.
Mitsuo Suga
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Charged-particle beam instrument
Publication number
20060219914
Publication date
Oct 5, 2006
JEOL Ltd.
Mitsuo Suga
G01 - MEASURING TESTING
Information
Patent Application
Method of inspecting pattern and inspecting instrument
Publication number
20030179007
Publication date
Sep 25, 2003
Hitachi, Ltd.
Mari Nozoe
G01 - MEASURING TESTING
Information
Patent Application
Method of inspecting pattern and inspecting instrument
Publication number
20010052781
Publication date
Dec 20, 2001
Mari Nozoe
G01 - MEASURING TESTING