MITSURU EGASHIRA

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IBARAKI, JP

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Patents Grantslast 30 patents

Information Patent Grant
Bimetallic probe with tip end
- Patent number 7,692,438
- Issue date Apr 6, 2010
- National Institute for Materials Science
- Kazumichi Machida
- G01 - MEASURING TESTING
Information Patent Grant
Process for precise arrangement of micro-bodies
- Patent number 7,323,227
- Issue date Jan 29, 2008
- Japan as represented by Director General of National Research Institute of Me...
- Hiroshi Fudoji
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
THERMOCOUPLE AND THERMOMETER USING THAT
- Publication number 20120120986
- Publication date May 17, 2012
- National Institute for Materials Science
- Takeshi Konno
- G01 - MEASURING TESTING
Information Patent Application
Probe
- Publication number 20080054916
- Publication date Mar 6, 2008
- Kazumichi Machida
- G01 - MEASURING TESTING
Information Patent Application
Process for precise arrangement of micro-bodies
- Publication number 20060231755
- Publication date Oct 19, 2006
- HIROSHI FUDOJI
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Process for precise arrangement of micro-bodies
- Publication number 20050056793
- Publication date Mar 17, 2005
- HIROSHI FUDOJI
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Process for precise arrangement of micro-bodies
- Publication number 20030168612
- Publication date Sep 11, 2003
- HIROSHI FUDOJI
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Process for precise arrangement of micro-bodies
- Publication number 20020113208
- Publication date Aug 22, 2002
- HIROSHI FUDOJI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROCESS FOR PRECISE ARRANGEMENT OF MICRO-BODIES
- Publication number 20010045524
- Publication date Nov 29, 2001
- HIROSHI FUDOJI
- H01 - BASIC ELECTRIC ELEMENTS