Mitsuru Kanokogi

Follow

Person

Tokyo-to, JP

People

Patents Grantslast 30 patents

Information Patent Grant
3-dimensional measuring device
- Patent number 11,733,357
- Issue date Aug 22, 2023
- Topcon Corporation
- Yasushi Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
3-dimensional measuring device
- Patent number 11,520,015
- Issue date Dec 6, 2022
- Topcon Corporation
- Yasushi Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Electronic distance measuring method and electronic distance measur...
- Patent number 8,908,158
- Issue date Dec 9, 2014
- Kabushiki Kaisha Topcon
- Ken-ichiro Yoshino
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optical distance measuring method and electro-optical dista...
- Patent number 8,781,780
- Issue date Jul 15, 2014
- Kabushiki Kaisha TOPCON
- Mitsuru Kanokogi
- G01 - MEASURING TESTING
Information Patent Grant
Distance measuring system
- Patent number 6,803,593
- Issue date Oct 12, 2004
- Kabushiki Kaisha Topcon
- Masahiro Ohishi
- G01 - MEASURING TESTING
Information Patent Grant
Distance measuring apparatus and distance measuring method
- Patent number 6,483,121
- Issue date Nov 19, 2002
- Kabushiki Kaisha Topcon
- Masahiro Ohishi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
3-DIMENSIONAL MEASURING DEVICE
- Publication number 20230077077
- Publication date Mar 9, 2023
- TOPCON CORPORATION
- Yasushi TANAKA
- G01 - MEASURING TESTING
Information Patent Application
3-DIMENSIONAL MEASURING DEVICE
- Publication number 20190064326
- Publication date Feb 28, 2019
- TOPCON CORPORATION
- Yasushi TANAKA
- G01 - MEASURING TESTING
Information Patent Application
Electronic Distance Measuring Method And Electronic Distance Measur...
- Publication number 20130003040
- Publication date Jan 3, 2013
- Kabushiki Kaisha TOPCON
- Ken-ichiro Yoshino
- G01 - MEASURING TESTING
Information Patent Application
Electro-Optical Distance Measuring Method And Electro-Optical Dista...
- Publication number 20110270563
- Publication date Nov 3, 2011
- KABUSHIKI KAISHA TOPCON
- Mitsuru Kanokogi
- G01 - MEASURING TESTING
Information Patent Application
Distance Measuring system
- Publication number 20020185618
- Publication date Dec 12, 2002
- Masahiro Ohishi
- G01 - MEASURING TESTING