Mitsuru Koizumi

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Particle beam system
- Patent number 8,158,937
- Issue date Apr 17, 2012
- Joel Ltd.
- Mitsuru Koizumi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for inspecting sample
- Patent number 8,119,994
- Issue date Feb 21, 2012
- Jeol Ltd.
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING
Information Patent Grant
Specimen holder, specimen inspection apparatus, and specimen inspec...
- Patent number 8,030,622
- Issue date Oct 4, 2011
- Jeol Ltd.
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method and reagent solution
- Patent number 7,906,760
- Issue date Mar 15, 2011
- Jeol Ltd.
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING
Information Patent Grant
Specimen holder, specimen inspection apparatus, specimen inspection...
- Patent number 7,745,802
- Issue date Jun 29, 2010
- Jeol Ltd.
- Hidetoshi Nishiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for diagnosing bone metastasis of malignant tumor
- Patent number 7,632,486
- Issue date Dec 15, 2009
- Etsuro Ogata
- G01 - MEASURING TESTING
Information Patent Grant
System and method for electron beam irradiation
- Patent number 6,831,278
- Issue date Dec 14, 2004
- Sony Corporation
- Masanobu Yamamoto
- G11 - INFORMATION STORAGE
Information Patent Grant
Electron beam irradiation apparatus and electron beam irradiating m...
- Patent number 6,737,660
- Issue date May 18, 2004
- Sony Corporation
- Yoshihisa Miura
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Control Method for Electron Microscope and Electron Microscope
- Publication number 20210074506
- Publication date Mar 11, 2021
- Mitsuru Koizumi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and Method for Inspecting Samples
- Publication number 20100243888
- Publication date Sep 30, 2010
- JEOL Ltd.
- Hidetoshi Nishiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Particle Beam System
- Publication number 20100051803
- Publication date Mar 4, 2010
- JEOL Ltd.
- Mitsuru Koizumi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Specimen Holder, Specimen Inspection Apparatus, and Specimen Inspec...
- Publication number 20100019146
- Publication date Jan 28, 2010
- JEOL Ltd.
- Hidetoshi Nishiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Specimen Holder, Specimen Inspection Apparatus, and Specimen Inspec...
- Publication number 20090314955
- Publication date Dec 24, 2009
- JEOL Ltd.
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING
Information Patent Application
Inspection Method and Reagent Solution
- Publication number 20090250609
- Publication date Oct 8, 2009
- JEOL Ltd.
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Method for Inspecting Sample
- Publication number 20090242762
- Publication date Oct 1, 2009
- JEOL Ltd.
- Hidetoshi Nishiyama
- G01 - MEASURING TESTING
Information Patent Application
Specimen Holder, Specimen Inspection Apparatus, Specimen Inspection...
- Publication number 20080308731
- Publication date Dec 18, 2008
- JEOL Ltd.
- Hidetoshi Nishiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron beam irradiation apparatus and electron beam irradiating m...
- Publication number 20030178581
- Publication date Sep 25, 2003
- Yoshihisa Miura
- G11 - INFORMATION STORAGE
Information Patent Application
System and method for electron beam irradiation
- Publication number 20030116718
- Publication date Jun 26, 2003
- SONY CORPORATION
- Masanobu Yamamoto
- G11 - INFORMATION STORAGE

Mitsuru Koizumi

Person

Patents Grantslast 30 patents

Particle beam system

Apparatus and method for inspecting sample

Specimen holder, specimen inspection apparatus, and specimen inspec...

Inspection method and reagent solution

Specimen holder, specimen inspection apparatus, specimen inspection...

Method for diagnosing bone metastasis of malignant tumor

System and method for electron beam irradiation

Electron beam irradiation apparatus and electron beam irradiating m...

Patents Applicationslast 30 patents

Control Method for Electron Microscope and Electron Microscope

Apparatus and Method for Inspecting Samples

Particle Beam System

Specimen Holder, Specimen Inspection Apparatus, and Specimen Inspec...

Specimen Holder, Specimen Inspection Apparatus, and Specimen Inspec...

Inspection Method and Reagent Solution

Apparatus and Method for Inspecting Sample

Specimen Holder, Specimen Inspection Apparatus, Specimen Inspection...

Electron beam irradiation apparatus and electron beam irradiating m...

System and method for electron beam irradiation