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Mitsuru Kowada
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Wako-shi, JP
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last 30 patents
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Patent Grant
Optical measurement probe and optical measurement device provided w...
Patent number
10,031,021
Issue date
Jul 24, 2018
Shimadzu Corporation
Ryoji Hiraoka
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
OPTICAL MEASUREMENT PROBE AND OPTICAL MEASUREMENT DEVICE PROVIDED W...
Publication number
20190094132
Publication date
Mar 28, 2019
Shimadzu Corporation
Ryoji HIRAOKA
G01 - MEASURING TESTING
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Patent Application
OPTICAL MEASUREMENT PROBE AND OPTICAL MEASUREMENT DEVICE PROVIDED W...
Publication number
20160349107
Publication date
Dec 1, 2016
Shimadzu Corporation
Ryoji Hiraoka
G01 - MEASURING TESTING