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Mitsuru Ogawa

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  • Capelle a/d IJssel, NL
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Patents Grantslast 30 patents

  • Information Patent Grant

    RTK-GPS surveying system
    • Patent number 7,460,065
    • Issue date Dec 2, 2008
    • Kabushiki Kaisha Topcon
    • Kazuhiro Ogawa
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    RTK-GPS surveying system
    • Publication number 20070241961
    • Publication date Oct 18, 2007
    • Kabushiki Kaisha TOPCON
    • Kazuhiro Ogawa
    • G01 - MEASURING TESTING