Mitsuru Okamura

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Mito, JP

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Patents Grantslast 30 patents

Information Patent Grant
Pattern check device and pattern check method
- Patent number 8,421,008
- Issue date Apr 16, 2013
- Hitachi High-Technologies Corporation
- Mari Nozoe
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CIRCUIT PATTERN INSPECTION APPARATUS AND CIRCUIT PATTERN INSPECTION...
- Publication number 20130082177
- Publication date Apr 4, 2013
- Hitachi High-Technologies Corporation
- Takashi Hiroi
- G01 - MEASURING TESTING
Information Patent Application
PATTERN CHECK DEVICE AND PATTERN CHECK METHOD
- Publication number 20110278452
- Publication date Nov 17, 2011
- Mari Nozoe
- H01 - BASIC ELECTRIC ELEMENTS