TREA

Mitsuru ONUMA

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Scanning electron microscope
    • Patent number 8,809,782
    • Issue date Aug 19, 2014
    • Hitachi High-Technologies Corporation
    • Tomohisa Ohtaki
    • F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
  • Information Patent Grant

    Mass spectrometer
    • Patent number 8,664,588
    • Issue date Mar 4, 2014
    • Hitachi High-Technologies Corporation
    • Hiroyuki Noda
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

  • Information Patent Application

    ELECTRON MICROSCOPE
    • Publication number 20140103208
    • Publication date Apr 17, 2014
    • Hitachi High-Technologies Corporation
    • Hiroyuki Noda
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    MASS SPECTROMETER
    • Publication number 20120248305
    • Publication date Oct 4, 2012
    • Hitachi High-Technologies Corporation
    • Hiroyuki NODA
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Application

    SCANNING ELECTRON MICROSCOPE
    • Publication number 20120127299
    • Publication date May 24, 2012
    • Tomohisa Ohtaki
    • H01 - BASIC ELECTRIC ELEMENTS