Mitsuru YOSHIDA

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Shiojiri, JP

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Patents Grantslast 30 patents

Information Patent Grant
Test circuit and testing method
- Patent number 11,879,930
- Issue date Jan 23, 2024
- Fuji Electric Co., Ltd.
- Mitsuru Yoshida
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor device test method
- Patent number 11,333,702
- Issue date May 17, 2022
- Fuji Electric Co., Ltd.
- Mitsuru Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor test circuit, semiconductor test apparatus, and semic...
- Patent number 10,996,260
- Issue date May 4, 2021
- Fuji Electric Co., Ltd.
- Mitsuru Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor test equipment
- Patent number 10,670,652
- Issue date Jun 2, 2020
- Fuji Electric Co., Ltd.
- Mitsuru Yoshida
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TESTING APPARATUS AND TESTING METHOD
- Publication number 20240142510
- Publication date May 2, 2024
- Fuji Electric Co., Ltd.
- Mitsuru YOSHIDA
- G01 - MEASURING TESTING
Information Patent Application
TEST CIRCUIT AND TESTING METHOD
- Publication number 20230128311
- Publication date Apr 27, 2023
- Fuji Electric Co., Ltd.
- Mitsuru YOSHIDA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SEMICONDUCTOR DEVICE TEST METHOD
- Publication number 20210255239
- Publication date Aug 19, 2021
- Fuji Electric Co., Ltd.
- Mitsuru YOSHIDA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TEST CIRCUIT, SEMICONDUCTOR TEST APPARATUS, AND SEMIC...
- Publication number 20190064249
- Publication date Feb 28, 2019
- Fuji Electric Co. Ltd.
- Mitsuru YOSHIDA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TEST EQUIPMENT
- Publication number 20190064251
- Publication date Feb 28, 2019
- Fuji Electric Co., Ltd.
- Mitsuru YOSHIDA
- G01 - MEASURING TESTING