Mitsushiro Yamaguchi

Person

Hachioji-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Optical analysis device, optical analysis method, and recording medium
- Patent number 11,119,022
- Issue date Sep 14, 2021
- Olympus Corporation
- Mitsushiro Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Optical analysis device, optical analysis method and computer progr...
- Patent number 10,371,631
- Issue date Aug 6, 2019
- Olympus Corporation
- Tetsuya Tanabe
- G02 - OPTICS
Information Patent Grant
Optical microscope device, microscopic observation method and compu...
- Patent number 10,310,245
- Issue date Jun 4, 2019
- OLYMPUS CORPORATION
- Mitsushiro Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
System for applying phantom sample to evaluate optical analysis dev...
- Patent number 9,797,839
- Issue date Oct 24, 2017
- Olympus Corporation
- Mitsushiro Yamaguchi
- G02 - OPTICS
Information Patent Grant
Optical analysis device, optical analysis method and computer progr...
- Patent number 9,435,727
- Issue date Sep 6, 2016
- Olympus Corporation
- Takuya Hanashi
- G01 - MEASURING TESTING
Information Patent Grant
Optical analysis device, optical analysis method and computer progr...
- Patent number 9,423,349
- Issue date Aug 23, 2016
- Olympus Corporation
- Tetsuya Tanabe
- G01 - MEASURING TESTING
Information Patent Grant
Optical analysis device, optical analysis method and computer progr...
- Patent number 9,329,117
- Issue date May 3, 2016
- Olympus Corporation
- Mitsushiro Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Optical analysis device and optical analysis method using a wavelen...
- Patent number 9,103,718
- Issue date Aug 11, 2015
- Olympus Corporation
- Takuya Hanashi
- G01 - MEASURING TESTING
Information Patent Grant
Optical analysis method using measurement of light of two or more w...
- Patent number 8,958,066
- Issue date Feb 17, 2015
- Olympus Corporation
- Takuya Hanashi
- G01 - MEASURING TESTING
Information Patent Grant
Optical analysis device, optical analysis method and computer progr...
- Patent number 8,803,106
- Issue date Aug 12, 2014
- Olympus Corporation
- Mitsushiro Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Optical analysis method using the light intensity of a single light...
- Patent number 8,785,886
- Issue date Jul 22, 2014
- Olympus Corporation
- Kazutaka Nishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Optical analysis device, optical analysis method and computer progr...
- Patent number 8,710,413
- Issue date Apr 29, 2014
- Olympus Corporation
- Mitsushiro Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring a diffusion characteristic value of a particle
- Patent number 8,681,332
- Issue date Mar 25, 2014
- Olympus Corporation
- Tetsuya Tanabe
- G01 - MEASURING TESTING
Information Patent Grant
Optical analysis device, optical analysis method and computer progr...
- Patent number 8,541,759
- Issue date Sep 24, 2013
- Olympus Corporation
- Mitsushiro Yamaguchi
- G01 - MEASURING TESTING
Information Patent Grant
Optical analysis device, optical analysis method and computer progr...
- Patent number 8,471,220
- Issue date Jun 25, 2013
- Olympus Corporation
- Mitsushiro Yamaguchi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL ANALYSIS DEVICE, OPTICAL ANALYSIS METHOD, AND RECORDING MEDIUM
- Publication number 20200033247
- Publication date Jan 30, 2020
- OLYMPUS CORPORATION
- Mitsushiro Yamaguchi
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MICROSCOPE DEVICE, MICROSCOPIC OBSERVATION METHOD AND COMPU...
- Publication number 20180356620
- Publication date Dec 13, 2018
- OLYMPUS CORPORATION
- Mitsushiro Yamaguchi
- G02 - OPTICS
Information Patent Application
OPTICAL MICROSCOPE DEVICE, MICROSCOPIC OBSERVATION METHOD AND COMPU...
- Publication number 20160139392
- Publication date May 19, 2016
- OLYMPUS CORPORATION
- Mitsushiro Yamaguchi
- G02 - OPTICS
Information Patent Application
SYSTEM FOR APPLYING PHANTOM SAMPLE TO EVALUATE OPTICAL ANALYSIS DEV...
- Publication number 20150355092
- Publication date Dec 10, 2015
- OLYMPUS CORPORATION
- Mitsushiro YAMAGUCHI
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL ANALYSIS DEVICE, OPTICAL ANALYSIS METHOD AND COMPUTER PROGR...
- Publication number 20150168212
- Publication date Jun 18, 2015
- OLYMPUS CORPORATION
- Mitsushiro YAMAGUCHI
- G02 - OPTICS
Information Patent Application
OPTICAL ANALYSIS DEVICE, OPTICAL ANALYSIS METHOD AND COMPUTER PROGR...
- Publication number 20140231619
- Publication date Aug 21, 2014
- OLYMPUS CORPORATION
- Mitsushiro Yamaguchi
- G02 - OPTICS
Information Patent Application
OPTICAL ANAYLSIS DEVICE, OPTICAL ANALYSIS METHOD AND COMPUTER PROGR...
- Publication number 20140170760
- Publication date Jun 19, 2014
- OLYMPUS CORPORATION
- Tetsuya Tanabe
- G02 - OPTICS
Information Patent Application
OPTICAL ANALYSIS DEVICE, OPTICAL ANALYSIS METHOD AND COMPUTER PROGR...
- Publication number 20140162268
- Publication date Jun 12, 2014
- OLYMPUS CORPORATION
- Tetsuya Tanabe
- G02 - OPTICS
Information Patent Application
OPTICAL ANALYSIS DEVICE, OPTICAL ANALYSIS METHOD AND COMPUTER PROGR...
- Publication number 20130338968
- Publication date Dec 19, 2013
- OLYMPUS CORPORATION
- Takuya Hanashi
- G02 - OPTICS
Information Patent Application
METHOD OF MEASURING A DIFFUSION CHARACTERISTIC VALUE OF A PARTICLE
- Publication number 20130314705
- Publication date Nov 28, 2013
- OLYMPUS CORPORATION
- Tetsuya Tanabe
- G02 - OPTICS
Information Patent Application
OPTICAL ANALYSIS DEVICE AND OPTICAL ANALYSIS METHOD USING A WAVELEN...
- Publication number 20130242307
- Publication date Sep 19, 2013
- OLYMPUS CORPORATION
- Takuya Hanashi
- G02 - OPTICS
Information Patent Application
OPTICAL ANALYSIS DEVICE, OPTICAL ANALYSIS METHOD AND COMPUTER PROGR...
- Publication number 20130228706
- Publication date Sep 5, 2013
- OLYMPUS CORPORATION
- Mitsushiro Yamaguchi
- G02 - OPTICS
Information Patent Application
OPTICAL ANALYSIS METHOD USING MEASUREMENT OF LIGHT OF TWO OR MORE W...
- Publication number 20130230874
- Publication date Sep 5, 2013
- OLYMPUS CORPORATION
- Takuya Hanashi
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL ANALYSIS METHOD USING THE LIGHT INTENSITY OF A SINGLE LIGHT...
- Publication number 20130228705
- Publication date Sep 5, 2013
- OLYMPUS CORPORATION
- Kazutaka Nishikawa
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL ANALYSIS DEVICE, OPTICAL ANALYSIS METHOD AND COMPUTER PROGR...
- Publication number 20130048875
- Publication date Feb 28, 2013
- OLYMPUS CORPORATION
- Mitsushiro Yamaguchi
- G02 - OPTICS
Information Patent Application
OPTICAL ANALYSIS DEVICE, OPTICAL ANALYSIS METHOD AND COMPUTER PROGR...
- Publication number 20120318956
- Publication date Dec 20, 2012
- OLYMPUS CORPORATION
- Mitsushiro Yamaguchi
- G02 - OPTICS
Information Patent Application
OPTICAL ANALYSIS DEVICE, OPTICAL ANALYSIS METHOD AND COMPUTER PROGR...
- Publication number 20120319009
- Publication date Dec 20, 2012
- OLYMPUS CORPORATION
- Mitsushiro Yamaguchi
- G02 - OPTICS
Information Patent Application
APPARATUS, METHOD AND COMPUTER PROGRAM FOR FLUORESCENCE CORRELATION...
- Publication number 20100301231
- Publication date Dec 2, 2010
- OLYMPUS CORPORATION
- Mitsushiro YAMAGUCHI
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT APPARATUS
- Publication number 20080117421
- Publication date May 22, 2008
- OLYMPUS CORPORATION
- Mitsushiro YAMAGUCHI
- G01 - MEASURING TESTING

Mitsushiro Yamaguchi

Person

Patents Grantslast 30 patents

Optical analysis device, optical analysis method, and recording medium

Optical analysis device, optical analysis method and computer progr...

Optical microscope device, microscopic observation method and compu...

System for applying phantom sample to evaluate optical analysis dev...

Optical analysis device, optical analysis method and computer progr...

Optical analysis device, optical analysis method and computer progr...

Optical analysis device, optical analysis method and computer progr...

Optical analysis device and optical analysis method using a wavelen...

Optical analysis method using measurement of light of two or more w...

Optical analysis device, optical analysis method and computer progr...

Optical analysis method using the light intensity of a single light...

Optical analysis device, optical analysis method and computer progr...

Method of measuring a diffusion characteristic value of a particle

Optical analysis device, optical analysis method and computer progr...

Optical analysis device, optical analysis method and computer progr...

Patents Applicationslast 30 patents

OPTICAL ANALYSIS DEVICE, OPTICAL ANALYSIS METHOD, AND RECORDING MEDIUM

OPTICAL MICROSCOPE DEVICE, MICROSCOPIC OBSERVATION METHOD AND COMPU...

OPTICAL MICROSCOPE DEVICE, MICROSCOPIC OBSERVATION METHOD AND COMPU...

SYSTEM FOR APPLYING PHANTOM SAMPLE TO EVALUATE OPTICAL ANALYSIS DEV...

OPTICAL ANALYSIS DEVICE, OPTICAL ANALYSIS METHOD AND COMPUTER PROGR...

OPTICAL ANALYSIS DEVICE, OPTICAL ANALYSIS METHOD AND COMPUTER PROGR...

OPTICAL ANAYLSIS DEVICE, OPTICAL ANALYSIS METHOD AND COMPUTER PROGR...

OPTICAL ANALYSIS DEVICE, OPTICAL ANALYSIS METHOD AND COMPUTER PROGR...

OPTICAL ANALYSIS DEVICE, OPTICAL ANALYSIS METHOD AND COMPUTER PROGR...

METHOD OF MEASURING A DIFFUSION CHARACTERISTIC VALUE OF A PARTICLE

OPTICAL ANALYSIS DEVICE AND OPTICAL ANALYSIS METHOD USING A WAVELEN...

OPTICAL ANALYSIS DEVICE, OPTICAL ANALYSIS METHOD AND COMPUTER PROGR...

OPTICAL ANALYSIS METHOD USING MEASUREMENT OF LIGHT OF TWO OR MORE W...

OPTICAL ANALYSIS METHOD USING THE LIGHT INTENSITY OF A SINGLE LIGHT...

OPTICAL ANALYSIS DEVICE, OPTICAL ANALYSIS METHOD AND COMPUTER PROGR...

OPTICAL ANALYSIS DEVICE, OPTICAL ANALYSIS METHOD AND COMPUTER PROGR...

OPTICAL ANALYSIS DEVICE, OPTICAL ANALYSIS METHOD AND COMPUTER PROGR...

APPARATUS, METHOD AND COMPUTER PROGRAM FOR FLUORESCENCE CORRELATION...

OPTICAL MEASUREMENT APPARATUS