Mitsutaka Niiro

Person

Hyogo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor integrated circuit device with internal power supply...
- Patent number 6,885,235
- Issue date Apr 26, 2005
- Renesas Technology Corp.
- Shigeki Tomishima
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device that can measure timing difference between inp...
- Patent number 6,794,679
- Issue date Sep 21, 2004
- Renesas Technology Corp.
- Mitsutaka Niiro
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device capable of adjusting timing of input waveform...
- Patent number 6,785,858
- Issue date Aug 31, 2004
- Renesas Technology Corp.
- Mitsutaka Niiro
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device removing disconnection defect in fuse element...
- Patent number 6,744,683
- Issue date Jun 1, 2004
- Renesas Technology Corp.
- Mitsutaka Niiro
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device having a column select line transmittin...
- Patent number 6,466,509
- Issue date Oct 15, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Hiroaki Tanizaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device capable of reducing leakage current flo...
- Patent number 6,411,560
- Issue date Jun 25, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Hiroaki Tanizaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device preventing repeated use of spare memory...
- Patent number 6,178,125
- Issue date Jan 23, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Mitsutaka Niiro
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor device that can measure timing difference between inp...
- Publication number 20040140466
- Publication date Jul 22, 2004
- RENESAS TECHNOLOGY CORP.
- Mitsutaka Niiro
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device removing disconnection defect in fuse element...
- Publication number 20030223260
- Publication date Dec 4, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Mitsutaka Niiro
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor integrated circuit device with internal power supply...
- Publication number 20030007296
- Publication date Jan 9, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Shigeki Tomishima
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor device capable of adjusting timing of input waveform...
- Publication number 20020026613
- Publication date Feb 28, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Mitsutaka Niiro
- G01 - MEASURING TESTING

Mitsutaka Niiro

Person

Patents Grantslast 30 patents

Semiconductor integrated circuit device with internal power supply...

Semiconductor device that can measure timing difference between inp...

Semiconductor device capable of adjusting timing of input waveform...

Semiconductor device removing disconnection defect in fuse element...

Semiconductor memory device having a column select line transmittin...

Semiconductor memory device capable of reducing leakage current flo...

Semiconductor memory device preventing repeated use of spare memory...

Patents Applicationslast 30 patents

Semiconductor device that can measure timing difference between inp...

Semiconductor device removing disconnection defect in fuse element...

Semiconductor integrated circuit device with internal power supply...

Semiconductor device capable of adjusting timing of input waveform...