Mitsutoshi WATABIKI

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Yokkaichi-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Pattern inspection apparatus and pattern inspection method
- Patent number 8,649,591
- Issue date Feb 11, 2014
- Kabushiki Kaisha Toshiba
- Makoto Kaneko
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PATTERN INSPECTION APPARATUS AND METHOD
- Publication number 20130063721
- Publication date Mar 14, 2013
- Kabushiki Kaisha Toshiba
- Takayoshi FUJII
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD
- Publication number 20120242985
- Publication date Sep 27, 2012
- Kabushiki Kaisha Toshiba
- Mitsutoshi WATABIKI
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD
- Publication number 20120243770
- Publication date Sep 27, 2012
- Kabushiki Kaisha Toshiba
- Makoto Kaneko
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD
- Publication number 20120242995
- Publication date Sep 27, 2012
- Kabushiki Kaisha Toshiba
- Yusaku KONNO
- G01 - MEASURING TESTING