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Mitsuyo Koya
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Kyoto-shi, JP
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Patents Grants
last 30 patents
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Patent Grant
Sample analyzer and sample analyzing method
Patent number
7,962,292
Issue date
Jun 14, 2011
Sysmex Corporation
Naohiko Matsuo
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Sample analyzer and sample analyzing method
Publication number
20080183431
Publication date
Jul 31, 2008
Sysmex Corporation
Naohiko Matsuo
G01 - MEASURING TESTING