Mitsuyoshi Koizumi

Person

Yokohama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
DNA base sequencer
- Patent number 6,284,119
- Issue date Sep 4, 2001
- Hitachi Electronics Engineering Co., Ltd.
- Hiroaki Machida
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for detecting extraneous substances on a glass plate
- Patent number 5,245,403
- Issue date Sep 14, 1993
- Hitachi Electronics Engineering Co., Ltd.
- Noboru Kato
- G01 - MEASURING TESTING
Information Patent Grant
Method of and apparatus for detecting foreign substances
- Patent number 5,225,886
- Issue date Jul 6, 1993
- Hitachi, Ltd.
- Mitsuyoshi Koizumi
- G01 - MEASURING TESTING
Information Patent Grant
Method of inspecting defects in circuit pattern and system for carr...
- Patent number 5,146,509
- Issue date Sep 8, 1992
- Hitachi, Ltd.
- Yasuhiko Hara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Foreign particle detecting method and apparatus
- Patent number RE33991
- Issue date Jul 14, 1992
- Hitachi, Ltd.
- Masataka Shiba
- 356 - Optics: measuring and testing
Information Patent Grant
Method of inspecting reticles and apparatus therefor
- Patent number 5,098,191
- Issue date Mar 24, 1992
- Hitachi, Ltd.
- Minori Noguchi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for detecting foreign matter and device for realizing same
- Patent number 5,046,847
- Issue date Sep 10, 1991
- Hitachi Ltd.
- Toshihiko Nakata
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for detecting abnormal patterns
- Patent number 4,952,058
- Issue date Aug 28, 1990
- Hitach, Ltd.
- Minori Noguchi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for correcting defects of X-ray mask
- Patent number 4,933,565
- Issue date Jun 12, 1990
- Hitachi, Ltd.
- Hiroshi Yamaguchi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of and apparatus for detecting foreign substance
- Patent number 4,922,308
- Issue date May 1, 1990
- Hitachi, Ltd.
- Minori Noguchi
- G01 - MEASURING TESTING
Information Patent Grant
Detection of surface particles by dual semiconductor lasers having...
- Patent number 4,814,596
- Issue date Mar 21, 1989
- Hitachi, Ltd.
- Mitsuyoshi Koizumi
- G01 - MEASURING TESTING
Information Patent Grant
Method of and apparatus for detecting foreign substances
- Patent number 4,740,079
- Issue date Apr 26, 1988
- Hitachi, Ltd.
- Mitsuyoshi Koizumi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting surface defects on the magnetic...
- Patent number 4,674,875
- Issue date Jun 23, 1987
- Hitachi, Ltd.
- Mitsuyoshi Koizumi
- G01 - MEASURING TESTING
Information Patent Grant
Foreign particle detecting method and apparatus
- Patent number 4,669,875
- Issue date Jun 2, 1987
- Hitachi, Ltd.
- Masataka Shiba
- G01 - MEASURING TESTING
Information Patent Grant
Exposure apparatus and method of aligning exposure mask with workpiece
- Patent number 4,668,089
- Issue date May 26, 1987
- Hitachi, Ltd.
- Yoshitada Oshida
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Automatic contaminants detection apparatus
- Patent number 4,614,427
- Issue date Sep 30, 1986
- Hitachi, Ltd.
- Mitsuyoshi Koizumi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for detecting contaminants on the reticle of exposure system
- Patent number 4,541,715
- Issue date Sep 17, 1985
- Hitachi, Ltd.
- Nobuyuki Akiyama
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Wafer transforming device
- Patent number 4,504,045
- Issue date Mar 12, 1985
- Hitachi, Ltd.
- Yukio Kenbo
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Exposure process and system
- Patent number 4,475,223
- Issue date Oct 2, 1984
- Hitachi, Ltd.
- Motoya Taniguchi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Test apparatus for defects of plate
- Patent number 4,460,273
- Issue date Jul 17, 1984
- Hitachi, Ltd.
- Mitsuyoshi Koizumi
- G01 - MEASURING TESTING
Information Patent Grant
Focusing position detecting device in optical magnifying and observ...
- Patent number 4,433,235
- Issue date Feb 21, 1984
- Hitachi, Ltd.
- Nobuyuki Akiyama
- G02 - OPTICS
Information Patent Grant
Method and apparatus for inspecting specimen surface
- Patent number 4,423,331
- Issue date Dec 27, 1983
- Hitachi, Ltd.
- Mitsuyoshi Koizumi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LASER PROCESSING APPARATUS
- Publication number 20100167431
- Publication date Jul 1, 2010
- Hironaru YAMAGUCHI
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

Mitsuyoshi Koizumi

Person

Patents Grantslast 30 patents

DNA base sequencer

Apparatus for detecting extraneous substances on a glass plate

Method of and apparatus for detecting foreign substances

Method of inspecting defects in circuit pattern and system for carr...

Foreign particle detecting method and apparatus

Method of inspecting reticles and apparatus therefor

Method for detecting foreign matter and device for realizing same

Method and apparatus for detecting abnormal patterns

Method and apparatus for correcting defects of X-ray mask

Method of and apparatus for detecting foreign substance

Detection of surface particles by dual semiconductor lasers having...

Method of and apparatus for detecting foreign substances

Method and apparatus for inspecting surface defects on the magnetic...

Foreign particle detecting method and apparatus

Exposure apparatus and method of aligning exposure mask with workpiece

Automatic contaminants detection apparatus

Apparatus for detecting contaminants on the reticle of exposure system

Wafer transforming device

Exposure process and system

Test apparatus for defects of plate

Focusing position detecting device in optical magnifying and observ...

Method and apparatus for inspecting specimen surface

Patents Applicationslast 30 patents

LASER PROCESSING APPARATUS