Mitsuyoshi MIYAZONO

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Nirasaki City, JP

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Patents Grantslast 30 patents

Information Patent Grant
Prober in which probe head of probe card is replaced automatically
- Patent number 10,082,524
- Issue date Sep 25, 2018
- Tokyo Electron Limited
- Mitsuyoshi Miyazono
- G01 - MEASURING TESTING
Information Patent Grant
Probe apparatus
- Patent number 9,194,906
- Issue date Nov 24, 2015
- Tokyo Electron Limited
- Mitsuyoshi Miyazono
- G01 - MEASURING TESTING
Information Patent Grant
Method for evaluating semiconductor device
- Patent number 8,471,585
- Issue date Jun 25, 2013
- Tokyo Electron Limited
- Mitsuyoshi Miyazono
- G01 - MEASURING TESTING
Information Patent Grant
Holding member for inspection, inspection device and inspecting method
- Patent number 8,159,245
- Issue date Apr 17, 2012
- Tokyo Electron Limited
- Shigekazu Komatsu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE APPARATUS, PROBE INSPECTION METHOD, AND STORAGE MEDIUM
- Publication number 20200049762
- Publication date Feb 13, 2020
- TOKYO ELECTRON LIMITED
- Tomohiro Ota
- G01 - MEASURING TESTING
Information Patent Application
PROBER
- Publication number 20160161527
- Publication date Jun 9, 2016
- TOKYO ELECTRON LIMITED
- Mitsuyoshi Miyazono
- G01 - MEASURING TESTING
Information Patent Application
PROBE APPARATUS
- Publication number 20130249581
- Publication date Sep 26, 2013
- TOKYO ELECTRON LIMITED
- Mitsuyoshi MIYAZONO
- G01 - MEASURING TESTING
Information Patent Application
Method for evaluating semiconductor device
- Publication number 20110050269
- Publication date Mar 3, 2011
- TOKYO ELECTRON LIMITED
- Mitsuyoshi Miyazono
- G01 - MEASURING TESTING
Information Patent Application
HOLDING MEMBER FOR INSPECTION, INSPECTION DEVICE AND INSPECTING METHOD
- Publication number 20100033199
- Publication date Feb 11, 2010
- TOKYO ELECTRON LIMITED
- Shigekazu Komatsu
- G01 - MEASURING TESTING