Mitsuyoshi Sato

Person

Chiba-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Electron beam apparatus
- Patent number 6,740,888
- Issue date May 25, 2004
- SII NanoTechnology Inc.
- Mitsuyoshi Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automatic focusing system for scanning electron microscope equipped...
- Patent number 6,621,082
- Issue date Sep 16, 2003
- Seiko Instruments Inc.
- Seiji Morita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam device
- Patent number 6,037,589
- Issue date Mar 14, 2000
- Seiko Instruments Inc.
- Akira Yonezawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mask-repairing device
- Patent number 4,930,439
- Issue date Jun 5, 1990
- Seiko Instruments Inc.
- Mitsuyoshi Sato
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method of correcting a pattern film
- Patent number 4,902,530
- Issue date Feb 20, 1990
- Seiko Instruments Inc.
- Anto Yasaka
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus for repairing a pattern film
- Patent number 4,851,097
- Issue date Jul 25, 1989
- Seiko Instruments Inc.
- Osamu Hattori
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Macroanalyzer system
- Patent number 4,467,199
- Issue date Aug 21, 1984
- Seiko Instruments & Electronics Ltd.
- Mitsuyoshi Sato
- G01 - MEASURING TESTING
Information Patent Grant
Method for measurement of distribution of inclusions in a slab by e...
- Patent number 4,331,872
- Issue date May 25, 1982
- Nippon Steel Corporation
- Hiromu Soga
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Electron beam apparatus
- Publication number 20030218135
- Publication date Nov 27, 2003
- Mitsuyoshi Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Automatic focusing system for scanning electron microscope equipped...
- Publication number 20030006372
- Publication date Jan 9, 2003
- SEIKO INSTRUMENTS, INC.
- Seiji Morita
- H01 - BASIC ELECTRIC ELEMENTS

Mitsuyoshi Sato

Person

Patents Grantslast 30 patents

Electron beam apparatus

Automatic focusing system for scanning electron microscope equipped...

Electron beam device

Mask-repairing device

Method of correcting a pattern film

Apparatus for repairing a pattern film

Macroanalyzer system

Method for measurement of distribution of inclusions in a slab by e...

Patents Applicationslast 30 patents

Electron beam apparatus

Automatic focusing system for scanning electron microscope equipped...